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MAX14803 Datasheet(PDF) 4 Page - Maxim Integrated Products |
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MAX14803 Datasheet(HTML) 4 Page - Maxim Integrated Products |
4 / 18 page Low-Charge Injection, 16-Channel, High-Voltage Analog Switches 4 _______________________________________________________________________________________ ELECTRICAL CHARACTERISTICS (continued) (VDD = +2.7V to +5.5V, VPP = +40V to VNN + 250V, VNN = -40V to -160V, TA = TMIN to TMAX, unless otherwise noted. Typical values are at TA = +25°C.) (Note 2) PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS VPP = +40V, VNN = -160V, VCOM_ = 0 820 VPP = +100V, VNN = -100V, VCOM_ = 0 600 Charge Injection Q VPP = +160V, VNN = -40V, VCOM_ = 0 350 pC LOGIC LEVELS Logic-Input Low Voltage VIL 0.75 V Logic-Input High Voltage VIH VDD - 0.75 V Logic-Output Low Voltage VOL ISINK = 1mA 0.4 V Logic-Output High Voltage VOH ISOURCE = 0.75mA VDD - 0.5 V Logic-Input Capacitance (Note 4) CIN 10 pF Logic-Input Leakage IIN -1 +1 µA TIMING CHARACTERISTICS (VDD = +2.7V to +5.5V, VPP = +40V to VNN + 200V, VNN = -40V to -160V, TA = TMIN to TMAX, unless otherwise noted. Typical values are at TA = +25°C.) (Note 2) PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS LOGIC TIMING (Figure 1) VDD = +5V ±10% 20 CLK Frequency fCLK VDD = +3V ±10% 10 MHz VDD = +5V ±10% 10 DIN to CLK Setup Time tDS VDD = +3V ±10% 16 ns VDD = +5V ±10% 3 DIN to CLK Hold Time tDH VDD = +3V ±10% 3 ns VDD = +5V ±10% 36 CLK to LE Setup Time tCS VDD = +3V ±10% 65 ns VDD = +5V ±10% 14 LE Low-Pulse Width tWL VDD = +3V ±10% 22 ns VDD = +5V ±10% 20 CLR High-Pulse Width tWC VDD = +3V ±10% 40 ns VDD = +5V ±10% 50 CLK Rise and Fall Times tR, tF VDD = +3V ±10% 50 ns VDD = +5V ±10% 6 42 CLK to DOUT Delay tDO VDD = +3V ±10% 12 80 ns Note 2: All devices are 100% tested at TA = +70°C. Limits over the operating temperature range are guaranteed by design and characterization. Note 3: The analog signal input VCOM_ and VNO_ must satisfy VNN ≤ (VCOM_, VNO_) ≤ VPP, or remain unconnected during power-up and power-down. Note 4: Guaranteed by characterization; not production tested. |
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