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087841-00 Datasheet(PDF) 2 Page - IXYS Corporation |
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087841-00 Datasheet(HTML) 2 Page - IXYS Corporation |
2 / 10 page MX878 2 06/08/06 Drawing No. 087809 www.claremicronix.com MX878 IXYS Absolute Maximum Ratings (Voltages with respect to GND=0V) Parameter Symbol Min Max Unit VPWR Supply Voltage VPWR 62 V Logic Supply Voltage VCC 6 V Input Pin Voltage VIN 6 V Continuous Output Current IOUT(OUT0-7) 250 mA Storage Temperature TSTG -55 150 C o Operating Ambient Temp TA -40 85 C o Operating Junction Temp TJ 150 C o Thermal Resistance (Junction to Ambient) RθJA 110 Typical C o/W ESD Warning ESD (electrostatic discharge) sensitive device. Although the MX878 features proprietary ESD protection circuitry, permanent damage may be sustained if subjected to high energy electrostatic discharges. Proper ESD precautions are recommended to avoid performance degradation or loss of functionality. DC Electrical Characteristics VCC=5.0V, VPWR=42V, TA=25 oC, unless otherwise specified. Parameter Condition Min Typ Max Unit Logic Supply Voltage 2.7 5.5 V Logic Supply Current fSCK = 5 MHz 50 µA Quiescent Logic Supply Current fSCK = 0 1 µA VPWR Voltage 6 60 V GND Current Total of all outputs 1000 mA Quiescent VPWR Current VPWR = 42V, No load 0.75 mA High Level Input Voltage IN0-7, SCK, SDI, OE, CS VCC-0.5 V Low Level Input Voltage 0.5 V Input Leakage Current 1 µA SDO Tri-State Leakage Current CS = Logic High 1 µA Out0-7 Current Any one output, sink 200 mA Out0-7 ON Resistance VPWR = 42V 4.5 Ω Out0-7 Tri-State Leakage Current OE = Logic Low 1 µA Notes: To avoid unwanted output during VPWR application and system initialization, keep OE at a logic low until CS has completed one cycle. Thermal Resistance is measured in still air with the device soldered to a 6 square inch board without a ground plane. Applications may require derating of the specified maximum currents to avoid exceeding the maximum operation junction temperature. Absolute Maximum Ratings are stress ratings. Stresses in excess of these ratings can cause permanent damage to the device. Functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this data sheet is not implied. Exposure of the device to the absolute maximum ratings for an extended period may degrade the device and affect its reliability. |
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