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5 page 
© 2009 Microchip Technology Inc. DS22182A-page 5 MCP6051/2/4 1.3 Test Circuits The circuit used for most DC and AC tests is shown in circuit’s common mode voltage ((VP +VM)/2), and that VOST includes VOS plus the effects (on the input offset error, VOST) of temperature, CMRR, PSRR and AOL. EQUATION 1-1: FIGURE 1-1: AC and DC Test Circuit for Most Specifications. G DM R F RG ⁄ = V CM V P V DD 2 ⁄ + () 2 ⁄ = V OUT V DD 2 ⁄ () V P V M – () V OST 1GDM + () ++ = Where: GDM = Differential Mode Gain (V/V) VCM = Op Amp’s Common Mode Input Voltage (V) VOST = Op Amp’s Total Input Offset Voltage (mV) V OST V IN– V IN+ – = VDD RG RF VOUT VM CB2 CL RL VL CB1 100 k Ω 100 k Ω RG RF VDD/2 VP 100 k Ω 100 k Ω 60 pF 10 k Ω 1µF 100 nF VIN– VIN+ CF 6.8 pF CF 6.8 pF MCP605X |
