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25AA640A/25LC640A DS21830D-page 4 © 2008 Microchip Technology Inc. TABLE 1-3: AC TEST CONDITIONS 17 THH HOLD hold time 20 40 80 — — — ns ns ns 4.5V ≤ Vcc ≤ 5.5V 2.5V ≤ Vcc < 4.5V 1.8V ≤ Vcc < 2.5V 18 THZ HOLD low to output High-Z 30 60 160 — — — ns ns ns 4.5V ≤ Vcc ≤ 5.5V(Note 1) 2.5V ≤ Vcc < 4.5V(Note 1) 1.8V ≤ Vcc < 2.5V(Note 1) 19 THV HOLD high to output valid 30 60 160 — — — ns ns ns 4.5V ≤ Vcc ≤ 5.5V 2.5V ≤ Vcc < 4.5V 1.8V ≤ Vcc < 2.5V 20 TWC Internal write cycle time — 5 ms 21 — Endurance 1M — E/W Cycles TABLE 1-2: AC CHARACTERISTICS (CONTINUED) AC CHARACTERISTICS Industrial (I): TA = -40°C to +85°C VCC = 1.8V to 5.5V Automotive (E): TA = -40°C to +125°C VCC = 2.5V to 5.5V Param. No. Sym. Characteristic Min. Max. Units Test Conditions Note 1: This parameter is periodically sampled and not 100% tested. 2: This parameter is not tested but ensured by characterization. For endurance estimates in a specific application, please consult the Total Endurance™ Model which can be obtained from Microchip’s web site at www.microchip.com. 3: TWC begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle is complete. AC Waveform: VLO = 0.2V — VHI = VCC - 0.2V (Note 1) VHI = 4.0V (Note 2) CL = 100 pF — Timing Measurement Reference Level Input 0.5 VCC Output 0.5 VCC Note 1: For VCC ≤ 4.0V 2: For VCC > 4.0V |
