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| PM75CL1A120 |
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 MITSUBISHI
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5 page 
MITSUBISHI <INTELLIGENT POWER MODULES> PM75CL1A120 FLAT-BASE TYPE INSULATED PACKAGE May 2009 5 PRECAUTIONS FOR TESTING 1. Before applying any control supply voltage (VD), the input terminals should be pulled up by resistors, etc. to their corre- sponding supply voltage and each input signal should be kept off state. After this, the specified ON and OFF level setting for each input signal should be done. 2. When performing “SC” tests, the turn-off surge voltage spike at the corresponding protection operation should not be al- lowed to rise above VCES rating of the device. (These test should not be done by using a curve tracer or its equivalent.) P, (U,V,W) U,V,W, (N) U,V,W, (N) VD (all) IN Fo IN Fo VD (all) VCIN (0V) Ic V V P, (U,V,W) VCIN (15V) – Ic Fig. 7 Dead time measurement point example Fig. 1 VCE(sat) Test Fig. 2 VEC, (VFM) Test 0V 1.5V 1.5V 1.5V 2V 2V 2V 0V t t tdead tdead tdead 1.5V: Input on threshold voltage Vth(on) typical value, 2V: Input off threshold voltage Vth(off) typical value IPM’ input signal VCIN (Upper Arm) IPM’ input signal VCIN (Lower Arm) 10% 90% trr Irr tr td(on) tc(on) tc(off) td(off) VCIN Ic VCE 10% 10% 10% 90% tf (ton = td(on) + tr) (toff = td(off) + tf) Fo P N N CS CS U,V,W Vcc Vcc Ic Ic VD (all) VD (all) P U,V,W VCIN VCIN VCIN (15V) VCIN (15V) Fo Fig. 3 Switching Time and SC Test Circuit Fig. 4 Switching Time Test Waveform a) Lower Arm Switching Signal input (Upper Arm) Signal input (Lower Arm) Signal input (Upper Arm) Signal input (Lower Arm) b) Upper Arm Switching VCIN Fig. 5 ICES Test Fig. 6 SC Test Waveform SC Trip Short Circuit Current toff(SC) VD (all) U,V,W, (N) P, (U,V,W) A Pulse VCE VCIN (15V) Ic Fo IN Fo Constant Current Fo Fo |
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