Electronic Components Datasheet Search |
|
MADS-002514-1116LP Datasheet(PDF) 1 Page - M/A-COM Technology Solutions, Inc. |
|
MADS-002514-1116LP Datasheet(HTML) 1 Page - M/A-COM Technology Solutions, Inc. |
1 / 4 page • North America Tel: 800.366.2266 / Fax: 978.366.2266 • Europe Tel: 44.1908.574.200 / Fax: 44.1908.574.300 • Asia/Pacific Tel: 81.44.844.8296 / Fax: 81.44.844.8298 Visit www.macom.com for additional data sheets and product information. M/A-COM Inc. and its affiliates reserve the right to make changes to the product(s) or information contained herein without notice. 1 SURMOUNTTM Low and Medium Barrier Silicon Schottky Diodes: Tee Pair M/A-COM Products Rev. V5 MA4E2514 Series ADVANCED: Data Sheets contain information regarding a product M/A-COM is considering for development. Performance is based on target specifications, simulated results, and/or prototype measurements. Commitment to develop is not guaranteed. PRELIMINARY: Data Sheets contain information regarding a product M/A-COM has under develop- ment. Performance is based on engineering tests. Specifications are typical. Mechanical outline has been fixed. Engineering samples and/or test data may be available. Commitment to produce in volume is not guaranteed. Features • Extremely Low Parasitic Capitance and Induc- tance • Surface Mountable in Microwave Circuits, No Wirebonds Required • Rugged HMIC Construction with Polyimide Scratch Protection • Reliable, Multilayer Metalization with a Diffusion Barrier, 100 % Stabilization Bake (300°C, 16 hours) • Lower Susceptibility to ESD Damage Description The MA4E2514 SURMOUNT TM Diode Tee Series are Silicon Low, and Medium Barrier Schottky De- vices fabricated with the patented Heterolithic Mi- crowave Integrated Circuit (HMIC) process. HMIC Circuits consist of Silicon pedestals which form di- odes or via conductors embedded in glass dielec- tric, which acts as the low dispersion, low loss mi- crostrip transmission medium. The combination of silicon and glass allows HMIC devices to have ex- cellent loss and power dissipation characteristics in a low profile, reliable device. The Surmount Schottky devices are excellent choices for circuits requiring the small parasitics of a beam lead device coupled with the superior me- chanical performance of a chip. The Surmount structure employs very low resistance silicon vias to connect the Schottky contacts to the metalized mounting pads on the bottom surface of the chip. These devices are reliable, repeatable, and a lower cost performance solution to conventional devices. They have lower susceptibility to electrostatic dis- charge than conventional beam lead Schottky di- odes. The multi-layer metallization employed in the fabri- cation of the Surmount Schottky junctions includes a platinum diffusion barrier, which permits all de- vices to be subjected to a 16-hour non-operating stabilization bake at 300°C. The “0505” outline allows for Surface Mount place- ment and multi-functional polarity orientations. A C B E DD Case Style 1116 DIM INCHES MIN. MAX. MIN. MAX. A 0.0445 0.0465 1.130 1.180 B 0.0445 0.0465 1.130 1.180 C 0.0040 0.0080 0.102 0.203 D Sq. 0.0128 0.0148 0.325 0.375 E 0.0128 0.0148 0.325 0.375 MILLIMETERS |
Similar Part No. - MADS-002514-1116LP |
|
Similar Description - MADS-002514-1116LP |
|
|
Link URL |
Privacy Policy |
ALLDATASHEET.COM |
Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Datasheet Upload | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |