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AS27C256-25ECAM Datasheet(PDF) 4 Page - Austin Semiconductor |
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AS27C256-25ECAM Datasheet(HTML) 4 Page - Austin Semiconductor |
4 / 13 page UVEPROM UVEPROM UVEPROM UVEPROM UVEPROM AS27C256 AS27C256 Rev. 2.0 7/06 Austin Semiconductor, Inc. reserves the right to change products or specifications without notice. 4 Austin Semiconductor, Inc. READ/OUTPUT DISABLE When the outputs of two or more AS27C256 are connected in parallel on the same bus, the output of any particular device in the circuit can be read with no interference from the compet- ing outputs of the other devices. To read the output of the selected AS27C256, a low-level signal is applied to E\ and G\. All other devices in the circuit should have their outputs disabled by applying a high-level signal to one of these pins. Output data is accessed at pins DQ0 through DQ7. LATCHUP IMMUNITY Latchup immunity on the AS27C256 is a minimum of 250mA on all inputs and outputs. This feature provides latchup im- munity beyond any potential transients at the printed cir- cuit board level when the EPROM is interfaced to industry standard TTL or MOS logic devices. Input/output layout approach controls latchup without compromising performance or packing density. POWER DOWN Active I CC supply current can be reduced from 25mA (AS27C256- 12 through AS27C256-25) to 1mA (TTL-level inputs) or 300µA (CMOS-level inputs) by applying a high TTL/CMOS signal to the E\ pin. In this mode all outputs are in the high-impedance state. ERASURE Before programming, the AS27C256 is erased by exposing the chip through the transparent lid to a high-intensity ultraviolet light (wavelength 2537 Å). EPROM erasure before program- ming is necessary to ensure that all bits are in the logic-high state. Logic-lows are programmed into the desired locations. A programmed logic-low can be erased only by ultraviolet light. The recommended minimum exposure dose (UV intensity x ex- posure time) is 15W•s/cm2. A typical 12mW/cm2, filterless UV lamp erases the device in 21 minutes. The lamp should be located about 2.5cm above the chip during erasure. After era- sure, all bits are in the high state. It should be noted that normal ambient light contains the correct wavelength for erasure; there- fore, when using the AS27C256, the window should be covered with an opaque label. FLASHRITE PULSE PROGRAMMING The AS27C256 EPROM is programmed by using the AMD FLASHRITE Pulse programming algorithm as illustrated by the flowchart in Figure 1. This algorithm programs the device in a nominal time of 4 seconds. Actual programming time varies as a function of the programmer used. Data is presented in parallel (eight bits) on pins DQ0 to DQ7. Once addresses and data are stable, E\ is pulsed. The FLASHRITE Pulse programming algorithm uses initial pulses of 100 microseconds (µs) followed by a byte-verifica- tion step to determine when the addressed byte has been suc- cessfully programmed. Up to 25 100µs pulses per byte are provided before a failure is recognized. The programming mode is achieved when V PP = 12.75V, V CC = 6.25V, G\ = V IH , and E\ = V IL . More than one device can be programmed when the devices are connected in parallel. Loca- tions can be programmed in any order. When the AMD FLASHRITE Pulse programming routine is completed, all bits are verified with V CC = V PP = 5V. PROGRAM INHIBIT Programming can be inhibited by maintaining a high-level input on E\. PROGRAM VERIFY Programmed bits can be verified with V PP = 12.75V when G\ = V IL , and E\ = V IH . SIGNATURE MODE The signature mode provides access to a binary code iden- tifying the manufacturer and device type. This mode is acti- vated when A9 is forced to 12V ±0.5V. Two identifier bytes are accessed by A0 (terminal 10); i.e., A0=V IL accesses the manu- facturer code, which is output on DQ0-DQ7; A0=V IH accesses the device code, which is also output on DQ0-DQ7. All other addresses must be held at VIL. Each byte contains odd parity on bit DQ7. The manufacturer code for these devices is 01h and the device code is 10h. |
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