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BU208A Datasheet(PDF) 4 Page - Motorola, Inc |
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BU208A Datasheet(HTML) 4 Page - Motorola, Inc |
4 / 6 page BU208A 4 Motorola Bipolar Power Transistor Device Data BASE DRIVE The Key to Performance By now, the concept of controlling the shape of the turn–off base current is widely accepted and applied in horizontal deflection design. The problem stems from the fact that good saturation of the output device, prior to turn–off, must be as- sured. This is accomplished by providing more than enough IB1 to satisfy the lowest gain output device hFE at the end of scan ICM. Worst–case component variations and maximum high voltage loading must also be taken into account. If the base of the output transistor is driven by a very low impedance source, the turn–off base current will reverse very quickly as shown in Fig. 3. This results in rapid, but only partial collector turn–off, because excess carriers become trapped in the high resistivity collector and the transistor is still conductive. This is a high dissipation mode, since the collector voltage is rising very rapidly. The problem is over- come by adding inductance to the base circuit to slow the base current reversal as shown in Fig. 4, thus allowing ac- cess carrier recombination in the collector to occur while the base current is still flowing. Choosing the right LB Is usually done empirically since the equivalent circuit is complex, and since there are several important variables (ICM, IB1, and hFE at ICM). One method is to plot fall time as a function of LB, at the desired conditions, for several devices within the hFE specification. A more infor- mative method is to plot power dissipation versus IB1 for a range of values of LB. This shows the parameter that really matters, dissipation, whether caused by switching or by saturation. For very low LB a very narrow optimum is obtained. This occurs when IB1 hFE ^ ICM, and therefore would be acceptable only for the “typical” device with constant ICM. As LB is increased, the curves become broader and flatter above the IB1. hFE = ICM point as the turn off “tails” are brought under control. Eventu- ally, if LB is raised too far, the dissipation all across the curve will rise, due to poor initiation of switching rather than tailing. Plotting this type of curve family for devices of different hFE, essentially moves the curves to the left, or right according to the relation IB1 hFE = constant. It then becomes obvious that, for a specified ICM, an LB can be chosen which will give low dissipation over a range of hFE and/or IB1. The only remain- ing decision is to pick IB1 high enough to accommodate the lowest hFE part specified. Neither LB nor IB1 are absolutely critical. Due to the high gain of Motorola devices it is sug- gested that in general a low value of IB1 be used to obtain optimum efficiency — eg. for BU208A with ICM = 4.5 A use IB1 [ 1.5 A, at ICM = 4 A use IB1 [ 1.2 A. These values are lower than for most competition devices but practical tests have showed comparable efficiency for Motorola devices even at the higher level of IB1. An LB of 10 µH to 12 µH should give satisfactory operation of BU208A with ICM of 4 to 4.5 A and IB1 between 1.2 and 2 A. TEST CIRCUIT WAVEFORMS Figure 3 Figure 4 IB IC IB IC (TIME) (TIME) TEST CIRCUIT OPTIMIZATION The test circuit may be used to evaluate devices in the conventional manner, i.e., to measure fall time, storage time, and saturation voltage. However, this circuit was designed to evaluate devices by a simple criterion, power supply input. Excessive power input can be caused by a variety of prob- lems, but it is the dissipation in the transistor that is of funda- mental importance. Once the required transistor operating current is determined, fixed circuit values may be selected. |
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