June 1999 TOKO, Inc.

Page 3

TK15329

A

VCC

50 K

50 K

50 K

50 K

VCC/2

SW6

~

10 kHz

1 Vrms

SW8

10 k

Ω

SW7

SW3

V

~

V

_

THD

SW2

SW5

SW4

VCC

33 µF

LH

SW1

SW9

1 kHz

1 Vrms

or

2 Vrms

~

LH

10 µF

10 µF

50 k

Ω

50 k

Ω

VCC / 2

TEST CIRCUITS AND METHODS

1: The above condition represents 1ch.

2: The above conditions distortion rate of 1-Ach and dynamic range measurement.

3: SW5 is for residual noise measurement.

4: SW8 is for cross talk (ISO or SEP) measurement.

SUPPLY CURRENT (FIGURE 1)

This current is a consumption current with a nonloading

condition.

1) Bias supply to Pin 2, 4, 9, 11. (This condition is the same

with other measurements, omitted from the next for

simplicity)

2) Connect Pin 5 to V

level.

3) Measure the inflow current to Pin 1 from V

This

current is the supply current.

Figure 1