SPT1175ACN datasheet(3/8 Pages) CADEKA

Part #	SPT1175ACN

Description	8-BIT, 20 MSPS CMOS A/D CONVERTER

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Manufacturer	CADEKA [Cadeka Microcircuits LLC.]

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SPT1175

ELECTRICAL SPECIFICATIONS

TA=+25 °C, AVDD=DVDD=+5.0 V, AGND=DGND=0.0 V, VRB=+0.6 V and VRT=+2.6 V, unless otherwise specified.

TEST

SPT1175

PARAMETERS

CONDITIONS

LEVEL

MIN

TYP

MAX

UNITS

Dynamic Performance

Signal-To-Noise Ratio

fS= 20 MSPS

fIN=1.0 MHz

I

44

46

dB

fIN=3.58 MHz

I

43

45

dB

fIN=10 MHz

V

39

dB

Spurious Free

Dynamic Range

fS= 20 MSPS

fIN=1.0 MHz

I

44

47

dB

fIN=3.58 MHz

I

41

44

dB

fIN=10 MHz

V

33

dB

Differential Phase

NTSC 20 IRE Mod Ramp

V

0.7

Degrees

Differential Gain

fS = 14.3 MSPS

V

1.0

%

Digital Inputs

Input Current, Logic High

VDD = 5.25 V, VIH = VDD

I

1.0

µA

Input Current, Logic Low

VDD = 5.25 V, VIL = DGND

I

1.0

µA

Pulse Width High (CLK)

IV

15

ns

Pulse Width Low (CLK)

IV

15

ns

Voltage, Logic High

I

4.0

V

Voltage, Logic Low

I

1.0

V

Digital Outputs

Output Current, High

VDD = 4.75 V

IV

-1.1

mA

Output Current, Low

VDD = 4.75 V

IV

3.5

mA

Output Current, High Z

VDD = 5.25 V, OE= VDD

IV

16

µA

Voltage High

I

4.0

V

Voltage Low

I

0.4

V

Power Supply Requirements

Analog Supply Voltage (AVDD)

IV

+4.75

+5.0

+5.25

V

Digital Supply Voltage (DVDD)

IV

+4.75

+5.0

+5.25

V

Supply Voltage Difference

(AVDD -DVDD)

IV

-0.1

0.0

0.1

V

Supply Current

fS=20 MSPS

I

18

27

mA

Power Dissipation

I

90

135

mW

TEST PROCEDURE

100% production tested at the specified temperature.

100% production tested at TA = +25 °C, and sample tested

at the specified temperatures.

QA sample tested only at the specified temperatures.

Parameter is guaranteed (but not tested) by design and

characterization data.

Parameter is a typical value for information purposes only.

100% production tested at TA = +25 °C. Parameter is

guaranteed over specified temperature range.

TEST LEVEL

I

II

III

IV

V

VI

TEST LEVEL CODES

All electrical characteristics are subject to the following

conditions:

All parameters having min/max specifications are guar-

anteed. The Test Level column indicates the specific

device testing actually performed during production

and Quality Assurance inspection. Any blank section in

the data column indicates that the specification is not

tested at the specified condition.

3

6/24/97

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