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SPT1175ACN Datasheet(PDF) 3 Page - Cadeka Microcircuits LLC. |
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SPT1175ACN Datasheet(HTML) 3 Page - Cadeka Microcircuits LLC. |
3 / 8 page SPT1175 ELECTRICAL SPECIFICATIONS TA=+25 °C, AVDD=DVDD=+5.0 V, AGND=DGND=0.0 V, VRB=+0.6 V and VRT=+2.6 V, unless otherwise specified. TEST TEST SPT1175 PARAMETERS CONDITIONS LEVEL MIN TYP MAX UNITS Dynamic Performance Signal-To-Noise Ratio fS= 20 MSPS fIN=1.0 MHz I 44 46 dB fIN=3.58 MHz I 43 45 dB fIN=10 MHz V 39 dB Spurious Free Dynamic Range fS= 20 MSPS fIN=1.0 MHz I 44 47 dB fIN=3.58 MHz I 41 44 dB fIN=10 MHz V 33 dB Differential Phase NTSC 20 IRE Mod Ramp V 0.7 Degrees Differential Gain fS = 14.3 MSPS V 1.0 % Digital Inputs Input Current, Logic High VDD = 5.25 V, VIH = VDD I 1.0 µA Input Current, Logic Low VDD = 5.25 V, VIL = DGND I 1.0 µA Pulse Width High (CLK) IV 15 ns Pulse Width Low (CLK) IV 15 ns Voltage, Logic High I 4.0 V Voltage, Logic Low I 1.0 V Digital Outputs Output Current, High VDD = 4.75 V IV -1.1 mA Output Current, Low VDD = 4.75 V IV 3.5 mA Output Current, High Z VDD = 5.25 V, OE= VDD IV 16 µA Voltage High I 4.0 V Voltage Low I 0.4 V Power Supply Requirements Analog Supply Voltage (AVDD) IV +4.75 +5.0 +5.25 V Digital Supply Voltage (DVDD) IV +4.75 +5.0 +5.25 V Supply Voltage Difference (AVDD -DVDD) IV -0.1 0.0 0.1 V Supply Current fS=20 MSPS I 18 27 mA Power Dissipation I 90 135 mW TEST PROCEDURE 100% production tested at the specified temperature. 100% production tested at TA = +25 °C, and sample tested at the specified temperatures. QA sample tested only at the specified temperatures. Parameter is guaranteed (but not tested) by design and characterization data. Parameter is a typical value for information purposes only. 100% production tested at TA = +25 °C. Parameter is guaranteed over specified temperature range. TEST LEVEL I II III IV V VI TEST LEVEL CODES All electrical characteristics are subject to the following conditions: All parameters having min/max specifications are guar- anteed. The Test Level column indicates the specific device testing actually performed during production and Quality Assurance inspection. Any blank section in the data column indicates that the specification is not tested at the specified condition. 3 6/24/97 |
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