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PO74HSTL85331ATR Datasheet(PDF) 4 Page - Potato Semiconductor Corporation |
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PO74HSTL85331ATR Datasheet(HTML) 4 Page - Potato Semiconductor Corporation |
4 / 8 page Power Supply Characteristics Symbol Description Test Conditions (1) Min Typ Max Unit IccQ Quiescent Power Supply Current Vcc=Max, Vin=Vcc or GND - 0.1 30 uA Notes: Notes: 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at Vcc = 3.3V, 25 °C ambient. 3. This parameter is guaranteed but not tested. 4. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. Switching Characteristics t i n U x a M ) 1 ( s n o i t i d n o C t s e T n o i t p i r c s e D l o b m y S tPD Propagation Delay CLK to Output pair CL = 15pF 3.7 ns tr/tf Rise/Fall Time 0.8V – 2.0V 0.8 ns tsk(o) Output Pin to Pin Skew (Same Package) ps ps tsk(pp) Output Skew (Different Package) fmax F p 5 1 = L C y c n e u q e r F t u p n I 250 MHz fmax F p 5 = L C y c n e u q e r F t u p n I 300 MHz fmax F p 2 = L C y c n e u q e r F t u p n I 400 MHz Notes: 1. See test circuits and waveforms. See schematic example. 2. tpLH, tpHL, tsk(p), and tsk(o) are production tested. All other parameters guaranteed but not production tested. 3. Airflow of 1m/s is recommended for frequencies above 133MHz 08/10/06 Copyright © Potato Semiconductor Corporation 4 PO74HSTL85331A 700MHz HSTL Potato Chip CL = 15pF, 125MHz CL = 15pF, 125MHz 50 300 400 570 700 Crystal Oscillator Test Conditions s n o i t i d n o C t s Output Frequency 50 3.579 14.318 28 250 400 462 e T ts i n U MHz MHz MHz X1=50MHz, C4=50pf, C5=50pf, R1=3K X1=3.579MHz, C4=100pf, C5=100pf X1=14.318MHz, C4=50pf, C5=50pf X1=28MHz, C4=50pf, C5=50pf, R1=5.1K X1=250MHz, C4=0, C5=0, R1=1K X1=400MHz, C4=0, C5=0, R1=1K X1=462MHz, C4=0, C5=0, R1=1K MHz MHz MHz MHz 3.3V 1:4 Crystal Oscillator/ Differential Clock or Data Fanout Buffer |
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