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PCS2I5T9050AF-28TT Datasheet(PDF) 5 Page - PulseCore Semiconductor |
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PCS2I5T9050AF-28TT Datasheet(HTML) 5 Page - PulseCore Semiconductor |
5 / 10 page November 2006 PCS2P5T9050A rev 0.2 2.5V Single Data Rate1:5 Clock Buffer Terabuffer 5 of 10 Notice: The information in this document is subject to change without notice. Input AC Test Conditions Symbol Parameter Value Units VIH Input HIGH Voltage VDD V VIL Input LOW Voltage 0 V VTH Input Timing Measurement Reference Level 1 VDD/2 V tR, tF Input Signal Edge Rate 2 2 V/nS NOTES: 1. A nominal 1.25V timing measurement reference level is specified to allow constant, repeatable results in an automatic test equipment (ATE) environment. 2. The input signal edge rate of 2V/nS or greater is to be maintained in the 10% to 90% range of the input waveform. AC Electrical Characteristics Over Operating Range 4 Symbol Parameter Min Typ Max Unit Skew Parameters tSK(O) Same Device Output Pin-to-Pin Skew 1 25 pS tSK(P) Pulse Skew 2 300 pS tSK(PP) Part-to-Part Skew 3 300 pS Propagation Delay tPLH tPHL Propagation Delay A to Qn 1.8 nS tR Output Rise Time (20% to 80%) 350 850 pS tF Output Fall Time (20% to 80%) 350 850 pS fO Frequency Range 200 MHz Output Gate Enable/Disable Delay tPGE Output Gate Enable to Qn 3.5 nS tPGD Output Gate Enable to Qn Driven to GL Designated Level 3 nS NOTES: 1. Skew measured between all outputs under identical input and output transitions and load conditions on any one device. 2. Skew measured is the difference between propagation delay times tPHL and tPLH of any output under identical input and output transitions and load conditions on any one device. 3. Skew measured is the magnitude of the difference in propagation times between any outputs of two devices, given identical transitions and load conditions at identical VDD levels and temperature. 4. Guaranteed by design. |
Similar Part No. - PCS2I5T9050AF-28TT |
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Similar Description - PCS2I5T9050AF-28TT |
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