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SDI453226-270F Datasheet(PDF) 3 Page - Superworld Electronics |
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SDI453226-270F Datasheet(HTML) 3 Page - Superworld Electronics |
3 / 7 page WIREWOUND CHIP INDUCTORS SDI453226 SERIES NOTE : Specifications subject to change without notice. Please check our website for latest information. SUPERWORLD ELECTRONICS (S) PTE LTD PG. 3 31.07.2008 6. RELIABILITY AND TEST CONDITION : Temp & Humidity More than 95% of termincal electrode should 28g<weight<136g : 30 Min. T : weight< 28g : 15 Min. be covered with solder. IPC J-STD-002B Solderability Test Physical Characteristics Tests MIL-STD-202G Method 208H Reference documents: MIL-STD-202G Method 107G Reference documents: Thermal shock test -40°C Solder temperature : 245±5°C Solder : Sn(63)/Pb(37) Flux : rosin flux Dip time : 5 secs. 93%RH 40°C 125°C Step 1 : -40°C for T time Step 2 : 125°C for T time Conditions of 1 cycle : Total : 20 cycles T 0 T Temp Room Time Change time < 5 min Temp Time 0 96H Test High temperature High humidity 1H 2. L/L<30% (Closed Magnetic Circuit) 3. Q/Q < 30% 4. DCR/DCR<10% L/L<10% 1. No case deformation or change in appearance. Low Temperature Storage Test Humidity Test Reference documents: MIL-STD-202G Method 103B Reference documents: IEC 68-2-1A 6.1 6.2 Reference documents: MIL-STD-202G Method 108A ITEM High Temperature Storage Test Environmental Tests Temperature : -25±2°C Tested while the specimens are still in the chamber Tested after 1 hour (less than 2 hours) at room temperature -25°C Temp Temp Measured after 24 hours Time : 96±2 hours Tested after 1 hour (less than 2 hours) at room temperature Exposure : Temperature : 40±2°C, Humidity : 93±3% RH, Dry oven at temperature of 40±5°C for 24 hours Room Time : 96±2 hours Time Low temperature 0 Test 96H TEST CONDITION Temp 85°C Temperature : 85±2°C Temp Room Tested after 1 hour (less than 2 hours) at room temperature PERFORMANCE Time : 96±2 hours Time 0 1H Test 96H High temperature 1. No case deformation or change in appearance. 4. DCR/DCR<10% 2. L/L<30% (Closed Magnetic Circuit) L/L<10% 3. Q/Q < 30% 1. No case deformation or change in appearance. 4. DCR/DCR<10% 3. Q/Q < 30% 2. L/L<30% (Closed Magnetic Circuit) L/L<10% Conditions Room 1. No case deformation or change in appearance. 2. L/L<30% (Closed Magnetic Circuit) 4. DCR/DCR<10% L/L<10% 3. Q/Q < 30% |
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