AMIS−39101

http://onsemi.com

11

CMD1

WR

Data transfer from Diagnostic Register

to Output Register at falling edge WR

CMD2

CMD3

CMD4

CMD5

CMD6

CMD7

CMD8

DIAG1

DIAG2

DIAG3

DIAG4

DIAG5

DIAG6

DIAG7

DIAG8

CLK

DIN

DOUT

OUT

OUT 1 TO 8

HiZ

HiZ

Data transfer from Input Register to

Command Register at rising edge WR

12

3

4

5

6

7

8

X

Figure 7. Timing Diagram

Quality and Reliability

A quality system with certification against TS16949 is

maintained.

An AEC−Q100 compatible product qualification is

performed. Monitoring of production is performed

according to the dedicated AMIS specifications for

assembly and wafer fabrication.

All products are tested using a production test program.

Lot conformance to specification in volume production is

guaranteed by means of following quality conformance

tests:

Table 13. QUALIFICATION

QC Test

Conditions

AQL Level

Inspection Level

Electrical functional

and parametric

To product data sheet

0.04

II

External visual

(mechanical)

Physical damage to body or leads (e.g. bent leads)

Dimensions affecting PCB manufacturability

(e.g. coplanarity)

0.15

II

External visual

(cosmetic)

Correctness of marking

All other cosmetic defects

0.65

II

NOTE: Each production lot will be accompanied with a Certificate of Conformance.

Company or Product Inquiries

For more information about ON Semiconductor’s products or services visit our Web site at http://www.onsemi.com.