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SN74ABT2827DW Datasheet(PDF) 3 Page - Texas Instruments |
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SN74ABT2827DW Datasheet(HTML) 3 Page - Texas Instruments |
3 / 6 page SN54ABT2827, SN74ABT2827 10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS648A – DECEMBER 1995 – REVISED JANUARY 1997 3 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 recommended operating conditions (see Note 3) SN54ABT2827 SN74ABT2827 UNIT MIN MAX MIN MAX UNIT VCC Supply voltage 4.5 5.5 4.5 5.5 V VIH High-level input voltage 2 2 V VIL Low-level input voltage 0.8 0.8 V VI Input voltage 0 VCC 0 VCC V IOH High-level output current –12 –12 mA IOL Low-level output current 12 12 mA ∆t/∆v Input transition rise or fall rate 5 5 ns/V TA Operating free-air temperature –55 125 –40 85 °C NOTE 3: Unused inputs must be held high or low to prevent them from floating. electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS TA = 25°C SN54ABT2827 SN74ABT2827 UNIT PARAMETER TEST CONDITIONS MIN TYP† MAX MIN MAX MIN MAX UNIT VIK VCC = 4.5 V, II = –18 mA –1.2 –1.2 –1.2 V VCC = 4.5 V, IOH = –1 mA 2.5 2.5 2.5 VOH VCC = 5 V, IOH = –1 mA 3 3 3 V VOH VCC =4 5V IOH = –3 mA 2.4 2.4 2.4 V VCC = 4.5 V IOH = –12 mA 2 2 2 VOL VCC = 4.5 V IOL = 12 mA 0.8 0.8 0.8 V Vhys 100 mV II VCC = 0 to 5.5 V, VI = VCC or GND ±1 ±1 ±1 µA IOZH VCC = 5.5 V, VO = 2.7 V 10‡ 10 10‡ µA IOZL VCC = 5.5 V, VO = 0.5 V –10‡ –10 –10‡ µA Ioff VCC = 0, VI or VO ≤ 4.5 V ±100 ±100 µA ICEX VCC = 5.5 V, VO = 5.5 V Outputs high 50 50 50 µA IO§ VCC = 5.5 V, VO = 2.5 V –50 –140 –225‡ –50 –225‡ –50 –225‡ mA VCC = 5.5 V, Outputs high 80 250 250 250 µA ICC VCC 5.5 V, IO = 0, Outputs low 35 40‡ 40‡ 40‡ mA VI = VCC or GND Outputs disabled 80 250 250 250 µA ¶ VCC = 5.5 V, Oi V Outputs enabled 1.5 1.5 1.5 mA ∆ICC¶ One input at 3.4 V, Other inputs at Outputs disabled 50 50 50 µA Other in uts at VCC or GND Control inputs 1.5 1.5 1.5 mA Ci VI = 2.5 V or 0.5 V 4 pF Co VO = 2.5 V or 0.5 V 8.5 pF † All typical values are at VCC = 5 V, TA = 25°C. ‡ This data sheet limit may vary among suppliers. § Not more than one output should be tested at a time, and the duration of the test should not exceed one second. ¶ This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND. PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. |
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