CY54/74FCT543T

3

Parameter

Description

Test Conditions

Min.

Max.

Unit

Output HIGH Voltage

Com’l

2.0

V

Com’l

2.4

3.3

V

Mil

2.4

3.3

V

Output LOW Voltage

Com’l

0.3

0.55

V

Mil

0.3

0.55

V

Input HIGH Voltage

2.0

V

Input LOW Voltage

0.8

V

All inputs

0.2

V

Input Clamp Diode Voltage

–0.7

–1.2

V

Input HIGH Current

5

µA

±1

µA

±1

µA

Off State HIGH-Level Output

Current

10

µA

Off State LOW-Level

Output Current

–10

µA

–60

–120

–225

mA

Power-Off Disable

±1

µA

Parameter

Description

Max.

Unit

Input Capacitance

5

10

pF

Output Capacitance

9

12

pF

Notes:

7.

8.

This parameter is specified but not tested.

9.

Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample

and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of

a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter