Specifications given herein may be changed at any time without prior notice. Please confirm technical specifications before you order and/or use.

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TN-100 R3

5. Measurement Method of L and Q

Nominal Inductance

Measurement

Measuring

Range (µH)

Method

Frequency (MHz)

0.005 ~ 0.10

100

0.12 ~ 0.82

Please see Method-1

25.2

1.0 ~ 8.2

7.96

10 ~ 82

Please see Method-2

2.52

100 ~ 330

0.796

Method-1

Test Equipment:

Hewlett Packard RF Impedance analyzer 4191A

Fixture:

Hewlett Packard Spring clip fixture 16092A

Electrical Length:

2.10 cm

Setting:

Please see the following figure

KL32

Center Post

0.087

(2.2)

Spacer (Unmagnetic Insulator)

Slide Clip Terminal

Method-2

Test Equipment:

Hewlett Packard LF Impedance analyzer 4192

Fixture:

Hewlett Packard Test fixture 16034E

OSC Level:

0.3 V

6. Test Condition

Unless otherwise specified, the test shall be performed in accordance

with JIS-C-5202 specifying marking measurements as follows:

Ambient temperature: 20 ± 15°C

Relative humidity:

65 ± 20%

If there may be any doubt on results, measurements shall be made

within the following limits:

Ambient temperature: 20 ± 2°C

Relative humidity:

65 ± 5%