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LTC6652AHMS8-4.096-TRPBF Datasheet(PDF) 11 Page - Linear Technology

Part # LTC6652AHMS8-4.096-TRPBF
Description  Precision Low Drift Low Noise Buffered Reference
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Manufacturer  LINER [Linear Technology]
Direct Link  http://www.linear.com
Logo LINER - Linear Technology

LTC6652AHMS8-4.096-TRPBF Datasheet(HTML) 11 Page - Linear Technology

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LTC6652
11
6652fb
APPLICATIONS INFORMATION
Figure 8. Start-Up Response Without Output Capacitor
Figure 9. Start-Up Response with 1μF Output Capacitor
Figure 10. Open-Drain Shutdown Circuit
Figure 11. Shutdown Response with 5mA Load
In Figure 8, ripple momentarily appears just after the leading
edge of powering on. This brief one time event is caused
by calibration circuitry during initialization. When an output
capacitor is used, the ripple is virtually undetectable as
shown in Figure 9.
Shutdown Mode
Shutdown mode is enabled by tying SHDN low which places
the part in a low power state (i.e., <2μA). In shutdown
mode, the output pin takes the value 20k • (rated output
voltage). For example, an LTC6652-2.5 will have an output
impedance of 20k • 2.5 = 50kΩ. For normal operation,
SHDN should be greater than or equal to 2.0V. For use
with a microcontroller, use a pull-up resistor to VIN and
an open-drain output driver as shown in Figure 10. The
LTC6652’s response into and out of shutdown mode is
shown in Figure 11.
The trip thresholds on SHDN have some dependence
on the voltage applied to VIN as shown in the Typical
Performance Characteristics section. Be careful to avoid
leaving SHDN at a voltage between the thresholds as
this will likely cause an increase in supply current due to
shoot-through current.
Long-Term Drift
Long-term drift cannot be extrapolated from acceler-
ated high temperature testing. This erroneous technique
gives drift numbers that are wildly optimistic. The only
way long-term drift can be determined is to measure it
over the time interval of interest. The LTC6652 long-term
drift data was collected on more than 100 parts that were
soldered into PC boards similar to a “real world” application.
The boards were then placed into a constant temperature
oven with TA = 35°C, their outputs were scanned regularly
and measured with an 8.5 digit DVM. Long-term drift is
shown below in Figure 12.
VIN
2V/DIV
VOUT
1V/DIV
100μs/DIV
6652 F08
COUT = 0μF
2.8V
VIN 13.2V
VOUT
TO μC
C1
1μF
C2
1μF
R1
20k
6652 F10
LTC6652-2.5
SHDN
2N7002
VOUT
VIN
GND
VIN
2V/DIV
VOUT
1V/DIV
100μs/DIV
6652 F09
COUT = 1μF
SHDN
1V/DIV
VOUT
1V/DIV
1ms/DIV
6652 F11
ILOAD = 5mA


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