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IL7824 Datasheet(PDF) 11 Page - IK Semicon Co., Ltd |
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IL7824 Datasheet(HTML) 11 Page - IK Semicon Co., Ltd |
11 / 21 page IL78XX IL7824 ELECTRICAL CHARACTERISTICS (Refer to test circuit, Tmin<Tj<Tmax, Io=500mA, VI=33V, Ci=0.33 ㎌, Co=0.1 ㎌, unless otherwise sprcified) Characteristic Symbol Test condition Min. Typ. Max. Unit Tj = 25 ° C 23 24 25 Output Voltage Vo 5.0mA ≤Io ≤1.0A, PD ≤15W VI = 27V to 38V VI = 28V to 38V 22.8 24 25.25 V VI = 27V to 38V 17 480 Line Regulation ∆Vo Tj = 25 ° C VI = 30V to 36V 6 240 Io = 5.0mA to 1.5A 15 480 Load Regulation ∆Vo Tj = 25 ° C Io = 250mA to 750mA 5 240 mV Quiescent current Iq Tj = 25 ° C 5.2 8 mA Io = 5mA to 1A 0.1 0.5 VI = 27V to 38V 0.5 1.0 Quiescent current Change ∆Iq VI = 28V to 38V mA Output voltage Drift ∆Vo/∆T Io = 5mA -1.5 mV/ ° C Output noise voltage Vn f = 10Hz to 100KHz, Ta = 25 ° C 60 ㎶ Ripple Rejection RR f = 120Hz, VI = 28V to 38V 50 67 dB Dropout voltage Vd Io = 1A, Tj = 25 ° C 2 V Peak current Ipk Tj = 25 ° C 2.2 A Output Resistance Ro f = 1KHz 28 Short circuit current Isc Vi = 35V, Ta = 25 ° C 230 mA * Load and lone regulation are specified at constant junction temperature. Changes in Vo due to heating effects must be taken into account separately. Pulse testing with low duty is used. Rev. 02 |
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