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LT1007ACH Datasheet(PDF) 10 Page - Linear Technology |
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LT1007ACH Datasheet(HTML) 10 Page - Linear Technology |
10 / 16 page 10 LT1007/LT1037 sn100737 100737fbs APPLICATIONS INFORMATION As with all operational amplifiers when RF > 2k, a pole will be created with RF and the amplifier’s input capacitance, creating additional phase shift and reducing the phase margin. A small capacitor (20pF to 50pF) in parallel with RF will eliminate this problem. Noise Testing The 0.1Hz to 10Hz peak-to-peak noise of the LT1007/ LT1037 is measured in the test circuit shown (Figure 5a). The frequency response of this noise tester (Figure 5b) indicates that the 0.1Hz corner is defined by only one zero. The test time to measure 0.1Hz to 10Hz noise should not exceed ten seconds, as this time limit acts as an additional zero to eliminate noise contributions from the frequency band below 0.1Hz. Measuring the typical 60nV peak-to-peak noise perfor- mance of the LT1007/LT1037 requires special test precautions: 1. The device should be warmed up for at least five minutes. As the op amp warms up, its offset voltage changes typically 3 µV due to its chip temperature increasing 10 °C to 20°C from the moment the power supplies are turned on. In the ten-second measurement interval these temperature-induced effects can easily exceed tens of nanovolts. 2. For similar reasons, the device must be well shielded from air currents to eliminate the possibility of thermo- electric effects in excess of a few nanovolts, which would invalidate the measurements. 3. Sudden motion in the vicinity of the device can also “feedthrough” to increase the observed noise. A noise voltage density test is recommended when mea- suring noise on a large number of units. A 10Hz noise voltage density measurement will correlate well with a 0.1Hz to 10Hz peak-to-peak noise reading since both results are determined by the white noise and the location of the 1/f corner frequency. Current noise is measured in the circuit shown in Figure 6 and calculated by the following formula: i e nV M n no = () −() ()( ) 2 2 12 130 101 1 101 • / Ω FREQUENCY (Hz) 100 90 80 70 60 50 40 30 0.01 1 10 100 1007/37F05b 0.1 1007/37 F05a 10 Ω 0.1 µF 4.7 µF VOLTAGE GAIN = 50,000 24.3k 100k – + * LT1007 LT1037 LT1001 2k 4.3k 110k 100k SCOPE × 1 RIN = 1M *DEVICE UNDER TEST NOTE: ALL CAPACITOR VALUES ARE FOR NONPOLARIZED CAPACITORS ONLY 2.2 µF 0.1 µF 22 µF Figure 5a. 0.1Hz to 10Hz Noise Test Circuit 1007/37 F06 100 Ω 100k LT1007 LT1037 500k 500k eno Figure 6 Figure 5b. 0.1Hz to 10Hz Peak-to- Peak Noise Tester Frequency Response |
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