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WS57C256F-45T Datasheet(PDF) 2 Page - STMicroelectronics |
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WS57C256F-45T Datasheet(HTML) 2 Page - STMicroelectronics |
2 / 5 page DC READ CHARACTERISTICS Over Operating Range with V PP = VCC SYMBOL PARAMETER TEST CONDITIONS MIN MAX UNITS VIL Input Low Voltage (Note 4) – 0.1 0.8 V VIH Input High Voltage (Note 4) 2.0 VCC + 0.3 V VOL Output Low Voltage IOL = 16 mA 0.4 V VOH Output High Voltage IOH = – 4 mA 2.4 V ISB1 VCC Standby Current (CMOS) CE = VCC ± 0.3 V Comm'l 200 µA (Note 1) Ind/Mil 500 µA ISB2 VCC Standby Current (TTL) CE = VIH (Note 2) Comm'l 3 mA Ind/Mil 5 mA ICC1 VCC Active Current (CMOS) (Notes 1 and 3) Comm'l 25 mA Outputs Not Loaded Ind/Mil 30 mA (Notes 2 and 3) Comm'l 50 mA ICC2 VCC Active Current (TTL) Outputs Not Loaded Ind/Mil 60 mA IPP VPP Supply Current VPP = VCC 100 µA VPP VPP Read Voltage VCC – 0.4 VCC V ILI Input Leakage Current VIN = 5.5V or Gnd –10 10 µA ILO Output Leakage Current VOUT = 5.5 V or Gnd –10 10 µA AC READ CHARACTERISTICS Over Operating Range. with V PP = VCC PARAMETER SYMBOL 57C256F-35 57C256F-45 57C256F-55 57C256F-70 UNITS MIN MAX MIN MAX MIN MAX MIN MAX Address to Output Delay tACC 35 45 55 70 CE to Output Delay tCE 35 45 55 70 OE to Output Delay tOE 15 20 25 30 ns Output Disable to Output Float tDF 20 20 25 30 Address to Output Hold tOH 0000 OPERATING RANGE RANGE TEMPERATURE VCC Commercial 0°C to +70°C +5V ± 10% Industrial –40°C to +85°C +5V ± 10% Military –55°C to +125°C +5V ± 10% WS57C256F 3-14 ABSOLUTE MAXIMUM RATINGS* Storage Temperature............................–65° to + 150°C Voltage on any Pin with Respect to Ground ....................................–0.6V to +7V VPP and A9 with Respect to Ground ......–0.6V to + 14V ESD Protection .................................................. >2000V *NOTICE: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods of time may affect device reliability. NOTES: 1. CMOS inputs: GND ± 0.3V or VCC ± 0.3V. 4. These are absolute voltages with respect to device ground pin and 2. TTL inputs: VIL ≤ 0.8V, VIH ≥ 2.0V. include all overshoots due to system and/or tester noise. 3. Add 3 mA/MHz for A.C. power component. Do not attempt to test these values without suitable equipment. |
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