6

0453H–PLD–7/05

ATF16V8CZ

4.4

Input Test Waveforms

4.4.1

Input Test Waveforms and Measurement Levels

t

4.4.2

Output Test Loads

Note:

Similar devices are tested with slightly different loads. These load differences may affect output

signals' delay and slew rate. Atmel devices are tested with sufficient margins to meet compatible

devices.

4.4.3

Pin Capacitance

Note:

1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100%

tested.

Table 4-1.

Pin Capacitance (f = 1 MHz, T = 25

°C(1))

Typ

Max

Units

Conditions

58

pF

C

OUT

68

pF

V