NX3L1T3157GW datasheet(11/20 Pages) NXP

Part #	NX3L1T3157GW

Description	Low-ohmic single-pole double-throw switch

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Manufacturer	NXP [NXP Semiconductors]

Direct Link	http://www.nxp.com

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NX3L1T3157_5

Product data sheet

Rev. 05 — 28 July 2008

11 of 20

NXP Semiconductors

NX3L1T3157

Low-ohmic single-pole double-throw switch

a. Test circuit

b. Input and output measurement points

Fig 15. Test circuit for measuring break-before-make timing

001aag571

GND

VCC

VEXT = 1.5 V

Y0

Y1

S

Z

VI

V

VO

RL

CL

G

001aag572

VI

tb-m

VO

0.9VO

0.5VI

Test data is given in Table 11.

Deﬁnitions test circuit:

RL = Load resistance.

CL = Load capacitance including jig and probe capacitance.

VEXT = External voltage for measuring switching times.

Fig 16. Load circuit for switching times

001aag642

S

Z

Y0

Y1

RL

CL

VCC

GND

VEXT = 1.5 V

switch

1

2

VI

V

VO

G

Table 11.

Test data

Supply voltage

Input

Load

VCC

VI

tr, tf

CL

RL

1.4 V to 3.6 V

VCC

≤ 2.5 ns

35 pF

50

Ω

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