ABSOLUTE MAXIMUM RATINGS

(1)

OPA827

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PRODUCT

PACKAGE-LEAD

PACKAGE DESIGNATOR

PACKAGE MARKING

Standard Grade

OPA827AI

SO-8

D

OPA827A

MSOP-8

DGK

NSP

High Grade

SO-8

D

OPA827

MSOP-8

DGK

NSP

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Shaded cells indicate product preview devices.

Over operating free-air temperature range (unless otherwise noted).

PARAMETER

VALUE

UNIT

Supply Voltage

40

V

(V–) – 0.5 to (V+) + 0.5

V

±10

mA

Differential Input Voltage

V

Continuous

Operating Temperature

–55 to +150

°C

Storage Temperature

–65 to +150

°C

Junction Temperature

+150

°C

Human Body Model (HBM)

4000

V

ESD Ratings

Charged Device Model (CDM)

1000

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

(2)

Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should

be current-limited to 10mA or less.

(3)

2

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