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H7N0401LD Datasheet(PDF) 4 Page - Renesas Technology Corp |
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H7N0401LD Datasheet(HTML) 4 Page - Renesas Technology Corp |
4 / 9 page H7N0401LD, H7N0401LS, H7N0401LM Rev.5.00 Apr 07, 2006 page 4 of 8 Case Temperature Tc (°C) Static Drain to Source on State Resistance vs. Temperature Drain Current ID (A) Forward Transfer Admittance vs. Drain Current 10 –50 0 50 100 150 200 0 2 4 6 8 VGS = 4.5 V 10 V 10, 20, 50 A ID = 10, 20, 50 A Pulse Test 1 3 10 30 100 100 1000 300 30 10 3 1 Tc = –25°C 75°C 25°C 300 1000 VDS = 10 V Pulse Test Reverse Drain Current IDR (A) Body to Drain Diode Reverse Recovery Time Drain to Source Voltage VDS (V) Typical Capacitance vs. Drain to Source Voltage Gate Charge Qg (nc) Dynamic Input Characteristics Drain Current ID (A) Switching Characteristics 12 10 20 5 50 100 1000 200 500 100 20 50 10 di / dt = 100 A / µs VGS = 0, Ta = 25°C 0 102030 4050 1000 3000 300 100 10000 30000 100 0 20 40 80 120 160 200 0 4 8 12 16 0 20 40 60 80 ID = 95 A VGS VDS 1000 200 100 500 50 20 10 0.1 0.3 3 10 100 30 1 VDD = 40 V 25 V 10 V VDD = 10 V 25 V 40 V VGS = 0 f = 1 MHz Ciss Coss Crss tr td(on) td(off) tf VGS = 10 V, VDD = 30 V PW = 5 µs, duty ≤ 1 % Rg = 4.7 Ω |
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