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FOD050LSD Datasheet(PDF) 4 Page - Fairchild Semiconductor

Part # FOD050LSD
Description  LVTTL/LVCMOS 3.3V High Speed Transistor Optocouplers
Download  13 Pages
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Manufacturer  FAIRCHILD [Fairchild Semiconductor]
Direct Link  http://www.fairchildsemi.com
Logo FAIRCHILD - Fairchild Semiconductor

FOD050LSD Datasheet(HTML) 4 Page - Fairchild Semiconductor

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©2003 Fairchild Semiconductor Corporation
www.fairchildsemi.com
FOD050L, FOD250L, FOD053L Rev. 1.0.2
4
Electrical Characteristics (Continued) (T
A = 0 to 70°C unless otherwise specified.)
Switching Characteristics (VCC = 3.3V)
Isolation Characteristics
*All Typicals at TA = 25°C
Notes:
2. The 1.9k
Ω load represents 1 TTL unit load of 1.6mA and 5.6kΩ pull-up resistor.
3. The 4.1k
Ω load represents 1 LSTTL unit load of 0.36mA and 6.1kΩ pull-up resistor.
4. Common mode transient immunity in logic high level is the maximum tolerable (positive) dVcm/dt on the leading
edge of the common mode pulse signal VCM, to assure that the output will remain in a logic high state
(i.e., VO > 2.0V). Common mode transient immunity in logic low level is the maximum tolerable (negative)
dVcm/dt on the trailing edge of the common mode pulse signal, VCM, to assure that the output will remain in a
logic low state (i.e., VO < 0.8V).
5. Device is considered a two terminal device: Pins 1, 2, 3 and 4 are shorted together and Pins 5, 6, 7 and 8 are
shorted together.
Symbol
Parameter
Test Conditions
Device
Min.
Typ.**
Max. Unit
TPHL
Propagation Delay
Time to Logic LOW
RL = 1.9kΩ, IF = 16mA
(2)
(Fig. 10)
25°C
All
1.0
µs
2.0
TPLH
Propagation Delay
Time to Logic HIGH
RL = 1.9kΩ, IF = 16mA
(2)
(Fig. 10)
25°C
All
1.0
µs
2.0
|CMH|
Common Mode
Transient Immunity
at Logic HIGH
IF = 0mA, VCM = 1,000VP-P,
RL = 4.1kΩ, TA = 25°C
(3,4) (Fig. 11)
All
5,000
50,000
V/µs
IF = 0mA, VCM = 1,000VP-P,
TA = 25°C, RL = 1.9kΩ
(2,4) (Fig. 11)
5,000
50,000
V/µs
|CML|
Common Mode
Transient Immunity
at Logic LOW
IF = 16mA, VCM = 1,000VP-P,
RL = 4.1kΩ. TA = 25°C
(3,4)
(Fig. 11)
All
5,000
35,000
V/µs
IF = 16mA, VCM = 1,000 VP-P,
RL = 1.9kΩ
(2,4) (Fig. 11)
5,000
35,000
V/µs
Symbol
Characteristics
Test Conditions
Device
Min.
Typ.**
Max.
Unit
II-O
Input-Output
Insulation Leakage
Current
Relative humidity = 45%,
TA = 25°C, t = 5s,
VI-O = 3000VDC
(5)
All
1.0
µA
VISO
Withstand Insulation
Test Voltage
f = 60Hz, TA = 25°C,
t = 1 min.(5)
FOD050L
FOD053L
2500
VRMS
FOD250L
5000
RI-O
Resistance
(input to output)
VI-O = 500VDC
(5)
All
1011
1012
CI-O
Capacitance
(input to output)
f = 1MHz(5)
All
0.2
pF


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