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DRV401-EP Datasheet(PDF) 2 Page - Texas Instruments |
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DRV401-EP Datasheet(HTML) 2 Page - Texas Instruments |
2 / 33 page Integrator Filter Probe Interface H−Bridge Driver V OUT REF IN I COMP2 R S I COMP1 Compensation Patents Pending. Diff Amp Timing, Error Detection, and Power Control Degauss V REF V REF GND +5V IS2 IS1 DRV401 I P Compensation Winding Magnetic Core Primary Winding Field Probe PWM PWM ABSOLUTE MAXIMUM RATINGS (1) DRV401-EP SBVS104 – JANUARY 2008............................................................................................................................................................................................... www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) PRODUCT PACKAGE-LEAD PACKAGE DESIGNATOR(2) PACKAGE MARKING DRV401 SO-20 DWP DRV401M (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. (2) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT Supply voltage +7 V Voltage(2) –0.5 VDD + 0.5 V Differential amplifier(3) –10 +10 V Signal Input terminals: Current at IS1 and IS2 ±75 mA Current (pins other than IS1 and IS2)(2) ±25 mA ICOMP short circuit (4) +250 mA Operating junction temperature –55 +150 °C Storage temperature –55 +150 °C Pins IAIN1 and IAIN2 only 1 kV Human body model ESD rating (HBM) All other pins 4 kV (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not supported. (2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5 V beyond the supply rails must be current limited, except for the differential amplifier input pins. (3) These inputs are not internally protected against over voltage. The differential amplifier input pins must be limited to 5 mA, max or ±10 V, max. (4) Power-limited; observe maximum junction temperature. 2 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): DRV401-EP |
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