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FXO-HC52 Series Page 5 of 15 © 2008 FOX ELECTRONICS | ISO9001:2000 Certified Jitter is frequency dependent. Below are typical values at select frequencies. Phase Jitter is integrated from HP3048 Phase Noise Measurement System; measured directly into 50 ohm input; VDD = 2.5V. TIE was measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software; VDD = 2.5V. Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications) Rj and Dj, measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software.Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications) Phase Jitter & Time Interval Error (TIE) Frequency Phase Jitter (12kHz to 20MHz) T I E (Sigma of Jitter Distribution) Units 62.5 MHz 2.1 3.1 pS RMS 106.25 MHz 1.2 3.5 pS RMS 125 MHz 1.1 2.7 pS RMS 156.25 MHz 0.8 3.7 pS RMS Random & Deterministic Jitter Composition Frequency Random (Rj) (pS RMS) Deterministic (Dj) (pS P-P) Total Jitter (Tj) (14 x Rj) + Dj 62.5 MHz 1.3 8.4 27.6 pS 106.25 MHz 1.4 8.3 27.7 pS 125 MHz 1.3 6.7 25.6 pS 156.25 MHz 1.4 9.7 29.5 pS Phase Noise 10 -160dBc -140dBc -150dBc -130dBc -120dBc -110dBc -90dBc -80dBc -100dBc -50dBc -70dBc -60dBc -20dBc -30dBc -40dBc 0 dBc -10dBc Data Collected using HP 3048A 1M 100k 10k 100 1k Offset Frequency (10Hz to 40MHz) 40M 10M 62.5 MHz 156.25MHz (dBc / Hz) vs. offset frequency 2.5V Phase Noise Graphs Four Frequencies from Jitter Tables 106.25 MHz 125MHz 62.5 MHz 156.25MHz 125MHz 62.5 MHz only to 2 MHz offset Equipment Limitation |
