Unless otherwise specified, all limits guaranteed for T

Boldface limits apply at the temperature extremes.

Symbol

Parameter

Conditions

Min

(Note 9)

Typ

(Note 8)

Max

(Note 9)

Units

V

O

Output Swing Positive

R

2.0

1.93

2.05

V

R

2.1

2.0

2.15

Output Swing Negative

R

0.95

1.0

1.07

V

R

0.85

0.90

1.0

I

SC

Output Short Circuit Current

Sourcing: V

−26

mA

Sinking: V

14

I

O

Linear Output Current

Sourcing: V

(Note 10)

−20

−13

−30

mA

Sinking: V

(Note 10)

12

8

20

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is

intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics.

Note 2: Human body model, 1.5k

Ω in series with 100pF

Note 3: Machine Model, 0

Ω in series with 200pF.

Note 4: Applies to both single-supply and split-supply operation. Continuous short circuit operation at elevated ambient temperature can result in exceeding the

maximum allowed junction temperature of 150˚C.

Note 5: Short circuit test is a momentary test. See next note.

Note 7: Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of

Note 8: Typical Values represent the most likely parametric norm.

Note 9: All limits are guaranteed by testing or statistical analysis.

Note 10: Positive current corresponds to current flowing into the device.

Note 11: Slew rate is the average of the positive and negative slew rate. Average Temperature Coefficient is determined by dividing the change in a parameter at

temperature extremes by the total temperature change.

Note 12: Average Temperature Coefficient is determined by dividing the change in a parameter at temperature extremes by the total temperature change.

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