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AMC1203DUB Datasheet(PDF) 5 Page - Texas Instruments |
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AMC1203DUB Datasheet(HTML) 5 Page - Texas Instruments |
5 / 23 page www.ti.com ELECTRICAL CHARACTERISTICS AMC1203 SBAS427 – FEBRUARY 2008 At TA = –40°C to +105°C, VDD1 = 4.5V to 5.5V, VDD2 = 4.5V to 5.5V, VIN+ = –280mV to +280mV, VIN– = 0V, and sinc 3 filter with OSR = 256, unless otherwise noted. AMC1203 PARAMETER TEST CONDITIONS MIN TYP(1) MAX UNIT RESOLUTION 16 Bits DC ACCURACY AMC1203 ±3 ±9 LSB INL Integral linearity error(2) AMC1203B ±2 ±6 LSB DNL Differential nonlinearity(3) –1 +1 LSB VOS Offset error(4) –1 ±0.1 1 mV TCVOS Offset error thermal drift ±1.5 ±5 µV/°C AMC1203 –2 ±0.2 2 % GERR Gain error AMC1203B –1 ±0.2 1 % TCGERR Gain error thermal drift ±20 ppm/ °C PSRR Power-supply rejection ratio 80 dB ANALOG INPUTS FSR Full-scale differential voltage input range (VIN+) – (VIN–) –320 320 mV VCM Operating common-mode signal(3) –0.1 5 V CI Input capacitance to GND1 VIN+ or VIN– 3 pF CID Differential input capacitance 6 pF RID Differential input resistance 28 k Ω IIL Input leakage current –5 5 nA CMTI Common-mode transient immunity 15 kV/ µs VIN from 0V to 5V at 0Hz 92 dB CMRR Common-mode rejection ratio VIN from 0V to 5V at 50kHz 105 dB INTERNAL CLOCK tCLK Clock period See Figure 2 83.33 100 125 ns fCLK Clock frequency See Figure 2 8 10 12 MHz tH Clock high-time See Figure 2 (tCLK/2) – 8 50 (tCLK/2) + 8 ns tD1 Data valid time after falling edge of clock See Figure 2 –2 0 2 ns AC ACCURACY SINAD Signal-to-noise + distortion fIN = 1kHz 80 85 dB SNR Signal-to-noise ratio fIN = 1kHz 80.5 85 dB AMC1203, fIN = 1kHz –92 –84.5 dB THD Total harmonic distortion AMC1203B, fIN = 1kHz –95 –88 AMC1203, fIN = 1kHz 86 92 dB SFDR Spurious-free dynamic range AMC1203B, fIN = 1kHz 89 95 (1) All typical values are at TA = +25°C (2) Integral nonlinearity is defined as the maximum deviation of the line through the inputs of the specified input range of the transfer curve of the specified VIN expressed either as number of LSBs, or as a percent of the specified 560mV input range. (3) Ensured by design. (4) Maximum values, including temperature drift, are ensured over the full specified temperature range. Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Link(s): AMC1203 |
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