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LMC660EP Datasheet(PDF) 11 Page - National Semiconductor (TI) |
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LMC660EP Datasheet(HTML) 11 Page - National Semiconductor (TI) |
11 / 15 page Application Hints (Continued) Bias Current Testing The test method of Figure 8 is appropriate for bench-testing bias current with reasonable accuracy. To understand its operation, first close switch S2 momentarily. When S2 is opened, then A suitable capacitor for C2 would bea5pFor10pF silver mica, NPO ceramic, or air-dielectric. When determining the magnitude of I b−, the leakage of the capacitor and socket must be taken into account. Switch S2 should be left shorted most of the time, or else the dielectric absorption of the capacitor C2 could cause errors. Similarly, if S1 is shorted momentarily (while leaving S2 shorted) where C x is the stray capacitance at the + input. 20114521 (Input pins are lifted out of PC board and soldered directly to components. All other pins connected to PC board.) FIGURE 7. Air Wiring 20114522 FIGURE 8. Simple Input Bias Current Test Circuit www.national.com 11 |
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