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IRM-8752-1 Datasheet(PDF) 8 Page - Everlight Electronics Co., Ltd |
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IRM-8752-1 Datasheet(HTML) 8 Page - Everlight Electronics Co., Ltd |
8 / 9 page EVERLIGHT ELECTRONICS CO.,LTD. Everlight Electronics Co., Ltd. http:\\www.everlight.com Rev 1.1 Page: 8 of 9 Device No:DMO-870-095 Prepared date:07-23-2004 Prepared by:CarryllHsu IRM-8752-1 Reliability Test Item And Condition The reliability of products shall be satisfied with items listed below. Confidence level:90% LTPD:10% Test Items Test Conditions Failure Judgement Criteria Samples(n) Defective(c) Temperature cycle 1 cycle -25℃ +85℃ (30min)(5min)(30min) 300 cycle test n=22,c=0 High temperature test Temp: +85℃ Vcc:5V 1000hrs n=22,c=0 Low temperature storage Temp: -40℃ 1000hrs n=22,c=0 High temperature High humidity Ta: 85℃,RH:85% 1000hrs n=22,c=0 Solder heat Temp: 260±5℃ 10sec 4mm From the bottom of the package. L0≦ L×0.8 L45≦ L×0.8 L: Lower specification limit n=22,c=0 |
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