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EM6132K800TFA-35F Datasheet(PDF) 4 Page - Eorex Corporation |
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EM6132K800TFA-35F Datasheet(HTML) 4 Page - Eorex Corporation |
4 / 12 page 32Kx8 LP SRAM EM6132K800W Series 4 DCC-SR-041001-A II. Vcc=5V PARAMETER SYMBOL TEST CONDITION MIN. TYP. *5 MAX. UNIT Supply Voltage Vcc 4.5 5.0 5.5 V Input High Voltage VIH*1 2.0 - Vcc+ 0.5 V Input Low Voltage VIL*2 -0.5 - 0.8 V Input Leakage Current ILI Vcc ≧ VIN ≧ Vss -1 - +1 µA Output Leakage Current ILO VCC ≧ VOUT ≧ VSS, Output Disabled -1 - 1 µA Output High Voltage VOH IOH = -1mA 2.4 - - V Output Low Voltage VOL IOL = 2mA - - 0.4 V -35 - 40 50 mA -55 - 35 45 mA ICC Cycle time = Min. CE# = VIL , II/O = 0mA -70 - 30 40 mA Average Operating Power supply Current ICC1 Cycle time = 1µs CE#≦0.2V and II/O = 0mA other pins at 0.2V or VCC-0.2V - 5 10 mA ISB CE# = VIH - 1 3 mA -L - 2 100 µA Standby Power Supply Current ISB1 CE# V ≧ VCC - 0.2V -LL 1 50*4 µA Notes: 1. VIH(max) = VCC + 3.0V for pulse width less than 10ns. 2. VIL(min) = VSS - 3.0V for pulse width less than 10ns. 3. Over/Undershoot specifications are characterized, not 100% tested. 4. 10µA for special request 5. Typical values are included for reference only and are not guaranteed or tested. Typical valued are measured at VCC = VCC(TYP.) and TA = 25°C CAPACITANCE (TA = 25°C , f = 1.0MHz) PARAMETER SYMBOL MIN. MAX. UNIT Input Capacitance CIN - 6 pF Input/Output Capacitance CI/O - 8 pF Note : These parameters are guaranteed by device characterization, but not production tested. AC TEST CONDITIONS Input Pulse Levels 0.2V to VCC - 0.2V Input Rise and Fall Times 3ns Input and Output Timing Reference Levels 1.5V Output Load CL = 50pF + 1TTL, IOH/IOL = -1mA/2mA |
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