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W40S11-23
7
Absolute Maximum Ratings
Stresses greater than those listed in this table may cause per-
manent damage to the device. These represent a stress rating
only. Operation of the device at these or any other conditions
above those specified in the operating sections of this specifi-
cation is not implied. Maximum conditions for extended peri-
ods may affect reliability.
Parameter
Description
Rating
Unit
VDD, VIN
Voltage on any pin with respect to GND
–0.5 to +7.0
V
TSTG
Storage Temperature
–65 to +150
°C
TA
Operating Temperature
0 to +70
°C
TB
Ambient Temperature under Bias
–55 to +125
°C
DC Electrical Characteristics: TA = 0°C to +70°C, VDD = 3.3V±5%
Parameter
Description
Test Condition/Comments
Min.
Typ.
Max.
Unit
IDD
3.3V Supply Current
BUF_IN = 100 MHz
250
mA
Logic Inputs
VIL
Input Low Voltage
GND–0.3
0.8
V
VIH
Input High Voltage
2.0
VDD+0.5
V
IILEAK
Input Leakage Current, BUF_IN
–5
+5
µA
IILEAK
Input Leakage Current[3]
–20
+5
µA
Logic Outputs (SDRAM0:12)
VOL
Output Low Voltage
IOL = 1 mA
50
mV
VOH
Output High Voltage
IOH = –1 mA
3.1
V
IOL
Output Low Current
VOL = 1.5V
65
100
160
mA
IOH
Output High Current
VOH = 1.5V
70
110
185
mA
Pin Capacitance/Inductance
CIN
Input Pin Capacitance
5pF
COUT
Output Pin Capacitance
6
pF
LIN
Input Pin Inductance
7nH
Note:
3.
SDATA and SCLOCK logic pins have 250-k
Ω internal pull-up resistors.