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CY7C145-15AC Datasheet(PDF) 6 Page - Cypress Semiconductor

Part # CY7C145-15AC
Description  8K x 8/9 Dual-Port Static RAM with SEM, INT, BUSY
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Manufacturer  CYPRESS [Cypress Semiconductor]
Direct Link  http://www.cypress.com
Logo CYPRESS - Cypress Semiconductor

CY7C145-15AC Datasheet(HTML) 6 Page - Cypress Semiconductor

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CY7C144
CY7C145
Document #: 38-06034 Rev. *C
Page 6 of 20
AC Test Loads and Waveforms
3.0V
GND
90%
90%
10%
≤ 3ns
≤ 3 ns
10%
ALL INPUT PULSES
(a) Normal Load (Load1)
5V
OUTPUT
C= 30 pF
VTH = 1.4V
OUTPUT
C = 30pF
(b) Thévenin Equivalent (Load 1)
(c) Three-State Delay (Load 3)
C= 30 pF
OUTPUT
Load (Load 2)
5V
OUTPUT
C= 5 pF
R1 = 893
R2 = 347
RTH = 250Ω
R1 = 893
R = 347
Switching Characteristics Over the Operating Range[9]
Parameter
Description
7C144-15
7C145-15
7C144-25
7C145-25
7C144-35
7C145-35
7C144-55
7C145-55
Unit
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
READ CYCLE
tRC
Read Cycle Time
15
25
35
55
ns
tAA
Address to Data Valid
15
25
35
55
ns
tOHA
Output Hold From Address
Change
33
33
ns
tACE
CE LOW to Data Valid
15
25
35
55
ns
tDOE
OE LOW to Data Valid
101520
25
ns
tLZOE[10, 11,12] OE Low to Low Z
3
3
3
3
ns
tHZOE[10, 11,12] OE HIGH to High Z
10
15
20
25
ns
tLZCE[10, 11,12] CE LOW to Low Z
3
3
3
3
ns
tHZCE[10, 11,12] CE HIGH to High Z
10
15
20
25
ns
tPU[12]
CE LOW to Power-Up
0
0
0
0
ns
tPD[12]
CE HIGH to Power-Down
15
25
35
55
ns
WRITE CYCLE
tWC
Write Cycle Time
15
25
35
55
ns
tSCE
CE LOW to Write End
12
20
30
45
ns
tAW
Address Set-Up to Write End
12
20
30
45
ns
tHA
Address Hold From Write End
2
2
2
2
ns
tSA
Address Set-Up to Write Start
0
0
0
0
ns
tPWE
Write Pulse Width
12
20
25
40
ns
Notes:
9. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
IOI/IOH and 30-pF load capacitance.
10. At any given temperature and voltage condition for any given device, tHZCE is less than tLZCE and tHZOE is less than tLZOE.
11. Test conditions used are Load 3.
12. This parameter is guaranteed but not tested.


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