U8600B

Preliminary Information

TELEFUNKEN Semiconductors

Rev. A1, 30-Aug-96

7 (12)

AC Characteristics (continued)

Parameter

Test Conditions /Pin

Symbol

Min.

Typ.

Max.

Unit

Pulse widths

50% of pulse amplitude

Write pulse width, wpwdata = 0

OPENB = 0

Twp0

13

17

ns

Write pulse width, wpwdata = 5

OPENB = 0

Twp5

36

44

ns

Write pulse width, wpwdata = F

OPENB = 0

Twp15

81

99

ns

Write pulse width increment

OPENB = 0

DTwp

3.5

6

ns

Off pulse width, opwdata = 0

wpwdata = 0

Top0

13

17

ns

Off pulse width, opwdata = 5

wpwdata = 0

Top5

36

44

ns

Off pulse width, opwdata = F

wpwdata = 0

Top15

81

99

ns

Off pulse width increment

wpwdata = 0

DTop

3.5

6

ns

Temperature drift

pulse width: 40 ns

DTp/Dd

14

ps/

°C

Operation control unit

Figure 4

Fail period

Tfail

2.6

3.5

µs

Serial interface

Figure 5

SCLOCK pulse cycle

TcySCK

100

ns

SCLOCK pulse width high

TwhSCK

40

ns

SCLOCK pulse width low

TwlSCK

40

ns

SENB set up time

TsSEN

20

ns

SENB hold time

ThSEN

20

ns

SDATA set up time

TsDSA

15

ns

SDATA hold time

ThDSA

15

ns

Data change delay time

Figure 6

Tdcha

1.5

µs

(*)

Test circuit with electrical feedback on page 10. Measurement with sampling head with 300 ps sampling time.

Peak-to-peak value of 1200 measurements, each measurement represents the average of 64 samples. These

(1)

Tdwd depends on DCLK frequency and write pulse width:

Tdwd = 2/fDCLK + Twp + 38 ns

(2)

Tdwg depends on write pulse width and off pulse width:

Tdwg = Twp + Top

(3)

Twd depends on write pulse width and off pulse width:

Twd

= Twp + Top + 12 ns