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X24320IG Datasheet(PDF) 11 Page - IC MICROSYSTEMS |
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X24320IG Datasheet(HTML) 11 Page - IC MICROSYSTEMS |
11 / 17 page X24320 11 Temperature under Bias X24320 .......................................–65°C to +135°C Storage Temperature ........................–65°C to +150°C Voltage on any Pin with Respect to VSS .................................... –1V to +7V D.C. Output Current ..............................................5mA Lead Temperature (Soldering, 10 seconds) .............................. 300°C D.C. OPERATING CHARACTERISTICS 7003 FRM T06 CAPACITANCE TA = +25°C, f = 1MHz, VCC = 5V 7003 FRM T07 Notes: (1)Must perform a stop command prior to measurement. (2)VIL min. and VIH max. are for reference only and are not 100% tested. (3)This parameter is periodically sampled and not 100% tested. Limits Symbol Parameter Min. Max. Units Test Conditions ICC1 VCC Supply Current (Read) 1 mA SCL = VCC X 0.1/VCC X 0.9 Levels @ 400KHz, SDA = Open, All Other Inputs = VSS or VCC – 0.3V ICC2 VCC Supply Current (Write) 3 mA ISB1 (1) VCC Standby Current 5 ∝ A SCL = SDA = VCC, All Other Inputs = VSS or VCC – 0.3V, VCC = 5V ± 10% ISB2 (1) VCC Standby Current 1 ∝ A SCL = SDA = VCC, All Other Inputs = VSS or VCC – 0.3V, VCC = 2.5V ILI Input Leakage Current 10 ∝ A VIN = VSS to VCC ILO Output Leakage Current 10 ∝ A VOUT = VSS to VCC VlL(2) Input LOW Voltage –0.5 VCC x 0.3 V VIH(2) Input HIGH Voltage VCC x 0.7 VCC + 0.5 V VOL Output LOW Voltage 0.4 V IOL = 3mA Vhys(3) Hysteresis of Schmitt Trigger Inputs VCC x 0.05 V Symbol Parameter Max. Units Test Conditions CI/O(3) Input/Output Capacitance (SDA) 8 pF VI/O = 0V CIN(3) Input Capacitance (S0, S1, S2, SCL, WP) 6 pF VIN = 0V RECOMMENDED OPERATING CONDITIONS 7003 FRM T04 Temperature Min. Max. Commercial 0°C +70°C Industrial –40°C +85°C 7003 FRM T05 Supply Voltage Limits X24320 4.5V to 5.5V X24320–2. 5 2.5V to 5.5V X24320–1. 8 1.8V to 3.6V *COMMENT Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and the functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. |
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