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6MBI150U4B-120 Datasheet(PDF) 7 Page - Fuji Electric |
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6MBI150U4B-120 Datasheet(HTML) 7 Page - Fuji Electric |
7 / 13 page H04-004-03a MS5F6013 13 7 Reliability Test Items Test cate- gories Test items Test methods and conditions Reference norms EIAJ ED-4701 (Aug.-2001 edition) Number of sample Accept- ance number 1 High temperature Test Method 101 5 ( 0 : 1 ) Reverse Bias Test temp. : Ta = 125±5 ℃ (Tj ≦ 150 ℃) Bias Voltage : VC = 0.8×VCES Bias Method : Applied DC voltage to C-E VGE = 0V Test duration : 1000hr. 2 High temperature Test Method 101 5 ( 0 : 1 ) Bias (for gate) Test temp. : Ta = 125±5 ℃ (Tj ≦ 150 ℃) Bias Voltage : VC = VGE = +20V or -20V Bias Method : Applied DC voltage to G-E VCE = 0V Test duration : 1000hr. 3 Temperature Test Method 102 5 ( 0 : 1 ) Humidity Bias Test temp. : 85±2 oC Condition code C Relative humidity : 85±5% Bias Voltage : VC = 0.8×VCES Bias Method : Applied DC voltage to C-E VGE = 0V Test duration : 1000hr. 4 Intermitted ON time : 2 sec. Test Method 106 5 ( 0 : 1 ) Operating Life OFF time : 18 sec. (Power cycle) Test temp. : Tj=100±5 deg ( for IGBT ) Tj ≦ 150 ℃, Ta=25±5 ℃ Number of cycles : 15000 cycles Failure Criteria Item Characteristic Symbol Failure criteria Unit Note Lower limit Upper limit Electrical Leakage current ICES - USL×2 mA characteristic ±IGES - USL×2 A Gate threshold voltage VGE(th) LSL×0.8 USL×1.2 mA Saturation voltage VCE(sat) - USL×1.2 V Forward voltage VF - USL×1.2 V Thermal IGBT VGE - USL×1.2 mV resistance or VCE FWD VF - USL×1.2 mV Isolation voltage Viso Broken insulation - Visual Visual inspection inspection Peeling - The visual sample - Plating and the others LSL : Lower specified limit. USL : Upper specified limit. Note : Each parameter measurement read-outs shall be made after stabilizing the components at room ambient for 2 hours minimum, 24 hours maximum after removal from the tests. And in case of the wetting tests, for example, moisture resistance tests, each component shall be made wipe or dry completely before the measurement. Each parameter measurement read-outs shall be made after stabilizing the components at room ambient for 2 hours minimum, 24 hours maximum after removal from the tests. And in case of the wetting tests, for example, moisture resistance tests, each component shall be made wipe or dry completely before the measurement. |
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