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HN4D02JU Datasheet(PDF) 1 Page - Toshiba Semiconductor |
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HN4D02JU Datasheet(HTML) 1 Page - Toshiba Semiconductor |
1 / 3 page HN4D02JU 2007-11-01 1 TOSHIBA Diode Silicon Epitaxial Planar Type HN4D02JU Ultra High Speed Switching Applications Low forward voltage : VF (3) = 0.90V (typ.) Fast reverse recovery time : trr = 1.6ns (typ.) Small total capacitance : CT = 0.9pF (typ.) Absolute Maximum Ratings (Ta = 25°C) Characteristic Symbol Rating Unit Maximum (peak) reverse voltage VRM 85 V Reverse voltage VR 80 V Maximum (peak) forward current IFM 300* mA Average forward current IO 100* mA Surge current (10ms) IFSM 2* A Power dissipation P 200** mW Junction temperature Tj 150 °C Storage temperature Tstg −55∼150 °C Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). * : Unit rating; Total rating = unit rating × 1.5 ** :Total rating Electrical Characteristics (Ta = 25°C) Characteristic Symbol Test Circuit Test Condition Min Typ. Max Unit VF (1) ― IF = 1mA ― 0.60 ― VF (2) ― IF = 10mA ― 0.72 ― Forward voltage VF (3) ― IF = 100mA ― 0.90 1.20 V IR (1) ― VR = 30V ― ― 0.1 Reverse current IR (2) ― VR = 80V ― ― 0.5 μA Total capacitance CT ― VR = 0, f = 1MHz ― 0.9 ― pF Reverse recovery time trr ― IF = 10mA, Fig.1 ― 1.6 ― ns Fig. 1 Reverse Recovery Time (trr) Test Circuit 1 . AN O D E1 2. CATHO D E 3 . AN O D E2 4 . AN O D E3 5 . AN O D E4 JEDEC ― JEITA ― TOSHIBA 1-2V1C Weight: 0.0062g (typ.) Unit: mm |
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