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TLP2630 Datasheet(PDF) 4 Page - Toshiba Semiconductor |
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TLP2630 Datasheet(HTML) 4 Page - Toshiba Semiconductor |
4 / 8 page TLP2630 2007-10-01 4 Switching Characteristics (Ta =25°C , VCC=5V) Characteristic Symbol Test Cir − cuit Test Condition Min. Typ. Max. Unit Propagation delay time to low output level tpHL 1 IF = 0→7.5mA, RL = 350Ω CL = 15pF (each channel) ⎯ 60 75 ns Propagation delay time to high output level tpLH 1 IF = 7.5mA→0, RL = 350Ω CL = 15pF (each channel) ⎯ 60 75 ns Output rise a time,output fall time(10~90%) tr,tf 1 IF = 0 7.5mA, RL = 350Ω CL = 15pF (each channel) ⎯ 30 ⎯ ns Common mode transient immunity at high output level CMH 2 IF = 0, RL = 350Ω VCM = 200V VO(min.) = 2V (each channel, Note 4) ⎯ 200 ⎯ V / μs Common mode transient immunity at low output level CML 2 IF = 7.5mA, RL = 350Ω VCM = 200V VO(max.) = 0.8V (each channel, Note 5) ⎯ −500 ⎯ V / μs (Note 1) 2mm below seating plane. (Note 2) The VCC supply voltage to each TLP2630 isolator must be bypassed by a 0.01μF capacitor or larger.This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins each device. (Note 3) Device considered a two −terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8 shorted together. (Note 4) CMH・the maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state(i.e., VOUT > 2.0V) (Note 5) CML・the maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state(i.e., VOUT > 0.8V) Measured in volts per microsecond(V / μs). (Note 6) Measured between pins 1 and 2 shorted together, and pins 3 and 4 shorted together. |
Similar Part No. - TLP2630_07 |
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Similar Description - TLP2630_07 |
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