CCD area image sensor

S9737 series

sElectrical and optical characteristics (Ta=25 °C, unless otherwise noted)

Parameter

Symbol

Remark

Min.

Typ.

Max.

Unit

Saturation output voltage

Vsat

-

-

Fw × Sv

-

V

Vertical

30

60

-

Full well

capacity

Horizontal

Fw

-

-

72

-

ke-

CCD node sensitivity

Sv

-4.5

-

µV/e-

+25 °C

-

100

1500

0 °C

-

5

75

Dark current

(MPP mode)

-70 °C

DS

-

0.0005

0.005

e-/pixel/s

Readout noise

Nr

-4

18

e-rms

Dynamic range (Area scanning)

-

15000

-

-

Spectral response range

λ

-

-

400 to 1100

-

nm

Photo response non-uniformity

PRNU

-

-

±10

%

Point defects

--

0

Cluster defects

--

0

Blemish

Column defects

-

--

0

-

Ω

*5: Dark current nearly doubles for every 5 to 7 °C increase in temperature.

*6: -40 °C, operating frequency is 80 kHz.

*7: DR = Fw / Nr

*8: Measured at half of the full well capacity. PRNU = noise / signal × 100 [%], noise: fixed pattern noise (peak to peak)

*9: White spots > 3 % of full well at 0 °C after Ts=1 s, Black spots > 50 % reduction in response relative to adjacent pixels

*10: A group of 2 to 9 continuous point defects

*11: A group of 10 or more continuous point defects

s Pin connections (S9737-01)

Pin No.

Symbol

Description

Remark

1

RG

Reset gate

-

2

RD

Reset drain

-

3

OS

Output source

-

4

OD

Output transistor drain

-

5

OG

Output gate

-

6

SG

Summing gate

-

7

P2H

CCD horizontal register clock-2

-

8

NC

No connection

-

9

P1H

CCD horizontal register clock-1

-

10

NC

No connection

-

11

IG2H

Test point (horizontal input gate-2)

Shorted to ground

12

IG1H

Test point (horizontal input gate-1)

Shorted to ground

13

ISH

Test point (horizontal input source)

Shorted to RD

14

TG

Transfer gate

-

15

P2V

CCD vertical register clock-2

-

16

NC

No connection

-

17

P1V

CCD vertical register clock-1

-

18

NC

No connection

-

19

NC

No connection

-

20

SS

Substrate (GND)

-

21

NC

No connection

-

22

ISV

Test point (vertical input source)

Shorted to RD

23

IG2V

Test point (vertical input gate-2)

Shorted to ground

24

IG1V

Test point (vertical input gate-1)

Shorted to ground

3