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TLC5615CD Datasheet(PDF) 3 Page - Texas Instruments |
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TLC5615CD Datasheet(HTML) 3 Page - Texas Instruments |
3 / 21 page www.ti.com ABSOLUTE MAXIMUM RATINGS RECOMMENDED OPERATING CONDITIONS ELECTRICAL CHARACTERISTICS TLC5615C, TLC5615I SLAS142E – OCTOBER 1996 – REVISED JUNE 2007 over operating free-air temperature range (unless otherwise noted)(1) UNIT Supply voltage (VDD to AGND) 7V Digital input voltage range to AGND –0.3V to VDD + 0.3V Reference input voltage range to AGND –0.3V to VDD + 0.3V Output voltage at OUT from external source VDD + 0.3V Continuous current at any terminal ±20mA Operating free-air temperature range, TA TLC5615C 0 °C to +70°C TLC5615I –40 °C to +85°C Storage temperature range, Tstg –65 °C to +150°C Lead temperature 1,6mm (1/16 inch) from case for 10 seconds +260 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. MIN NOM MAX UNIT Supply voltage, VDD 4.5 5 5.5 V High-level digital input voltage, VIH 2.4 V Low-level digital input voltage, VIL 0.8 V Reference voltage, Vref to REFIN terminal 2 2.048 VDD–2 V Load resistance, RL 2 k Ω TLC5615C 0 70 °C Operating free-air temperature, TA TLC5615I 40 85 °C over recommended operating free-air temperature range, V DD = 5V ± 5%, Vref = 2.048V (unless otherwise noted) STATIC DAC SPECIFICATIONS PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Resolution 10 bits Integral nonlinearity, end point adjusted (INL) Vref = 2.048V, See (1) ±1 LSB Differential nonlinearity (DNL) Vref = 2.048V, See (2) ±0.1 ±0.5 LSB EZS Zero-scale error (offset error at zero scale) Vref = 2.048V, See (3) ±3 LSB Zero-scale-error temperature coefficient Vref = 2.048V, See (4) 3 ppm/ °C EG Gain error Vref = 2.048V, See (5) ±3 LSB Gain-error temperature coefficient Vref = 2.048V, See (6) 1 ppm/ °C Zero scale 80 PSRR Power-supply rejection ratio See (7)(8) dB Gain 80 Analog full scale output RL = 100kΩ 2Vref(1023/1024) V (1) The relative accuracy or integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum deviation of the output from the line between zero and full scale excluding the effects of zero code and full-scale errors (see text). Tested from code 3 to code 1024. (2) The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and ideal 1LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains constant) as a change in the digital input code. Tested from code 3 to code 1024. (3) Zero-scale error is the deviation from zero-voltage output when the digital input code is zero (see text). (4) Zero-scale-error temperature coefficient is given by: EZS TC = [EZS (Tmax) – EZS (Tmin)]/Vref × 106/(Tmax– Tmin). (5) Gain error is the deviation from the ideal output (Vref – 1LSB) with an output load of 10kΩ excluding the effects of the zero-scale error. (6) Gain temperature coefficient is given by: EG TC = [EG(Tmax) – EG (Tmin)]/Vref × 106/(Tmax– Tmin). (7) Zero-scale-error rejection ratio (EZS-RR) is measured by varying the VDD from 4.5V to 5.5V dc and measuring the proportion of this signal imposed on the zero-code output voltage. (8) Gain-error rejection ratio (EG-RR) is measured by varying the VDD from 4.5V to 5.5V dc and measuring the proportion of this signal imposed on the full-scale output voltage after subtracting the zero-scale change. 3 Submit Documentation Feedback |
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