Everlight Electronics Co., Ltd.

http:\\www.everlight.com

Rev 3

Page: 6 of 7

Device No：DIR-033-087

Prepared date：07-20-2005

Prepared by：Jaine Tsai

IR333C/H0/L10

Reliability Test Item And Condition

The reliability of products shall be satisfied with items listed below.

Confidence level：90%

LTPD：10%

NO. Item

Test Conditions

Test Hours/

Cycles

Sample

Sizes

Failure

Judgement

Criteria

Ac/Re

1

Solder Heat

TEMP.：260℃±5℃

10secs

22pcs

0/1

2

Temperature Cycle H : +100℃

15mins

5mins

L : -40℃

15mins

300Cycles 22pcs

0/1

3

Thermal Shock

H :+100℃

5mins

10secs

L :-10℃

5mins

300Cycles 22pcs

0/1

4

High Temperature

Storage

TEMP.：+100℃

1000hrs

22pcs

0/1

5

Low Temperature

Storage

TEMP.：-40℃

1000hrs

22pcs

0/1

6

DC Operating Life

1000hrs

22pcs

0/1

7

High Temperature/

High Humidity

85℃ / 85% R.H

1000hrs

22pcs

Ee≦L×0.8

U：Upper

Specification

Limit

L：Lower

Specification

Limit

0/1