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CY62157CV30/33
Document #: 38-05014 Rev. *F
Page 5 of 13
Capacitance[7]
Parameter
Description
Test Conditions
Max.
Unit
CIN
Input Capacitance
TA = 25°C, f = 1 MHz,
VCC = VCC(typ.)
6pF
COUT
Output Capacitance
8
pF
AC Test Loads and Waveforms
VCC Typ
VCC
OUTPUT
R2
30 pF
INCLUDING
JIG AND
SCOPE
GND
90%
10%
90%
10%
OUTPUT
VTH
Equivalent to:
THÉVENIN EQUIVALENT
ALL INPUT PULSES
RTH
R1
Rise TIme: 1 V/ns
Fall Time: 1 V/ns
Parameters
3.0V
3.3V
Unit
R1
1.105
1.216
ΚΩ
R2
1.550
1.374
ΚΩ
RTH
0.645
0.645
ΚΩ
VTH
1.75
1.75
V
Data Retention Characteristics (Over the Operating Range)
Parameter
Description
Conditions
Min.
Typ.[2]
Max.
Unit
VDR
VCC for Data Retention
1.5
V
ICCDR
Data Retention Current
VCC = 1.5V, CE1 > VCC – 0.2V or
CE2 < 0.2V,
VIN > VCC – 0.2V or VIN < 0.2V
Auto-A
4
20
µA
Auto-E
460
µA
tCDR
[8]
Chip Deselect to Data
Retention Time
0ns
tR
[8]
Operation Recovery Time
tRC
ns
Data Retention Waveform[9]
Notes:
8. Full Device AC operation requires linear VCC ramp from VDR to VCC(min.) > 100 µs or stable at VCC(min.) >100 µs.
9. BHE.BLE is the AND of both BHE and BLE. Chip can be deselected by either disabling the chip enable signals or by disabling both BHE and BLE.
VCC(min.)
VCC(min.)
tCDR
VDR > 1.5 V
DATA RETENTION MODE
tR
CE1 or
VCC
BHE.BLE
CE2
or
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