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IDTIDT71P79804200BQI Datasheet(PDF) 2 Page - Integrated Device Technology

Part # IDTIDT71P79804200BQI
Description  18Mb Pipelined DDR?줚I SIO SRAM Burst of 2
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Manufacturer  IDT [Integrated Device Technology]
Direct Link  http://www.idt.com
Logo IDT - Integrated Device Technology

IDTIDT71P79804200BQI Datasheet(HTML) 2 Page - Integrated Device Technology

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IDT71P79204 (2Mx8-Bit), 71P79104 (2Mx9-Bit), 71P79804 (1Mx18-Bit) 71P79604 (512Kx36-Bit)
18 Mb DDR II SIO SRAM Burst of 2
Commercial and Industrial Temperature Ranges
Clocking
The DDRII SIO SRAM has two sets of input clocks, namely the K,
K clocks and the C, C clocks. In addition, the DDRII SIO has an output
“echo” clock, CQ,
CQ.
The K and
K clocks are the primary device input clocks. The K
clock is, used to clock in the control signals (
LD, R/W and BWx or NWx),
the address, and the first word of the data burst during a write operation.
The
K clock is used to clock in the control signals (BWx or NWx) and the
second word of the data burst during a write operation. The K and
K
clocks are also used internally by the SRAM. In the event that the user
disables the C and
C clocks, the K and K clocks will also be used to clock
the data out of the output register and generate the echo clocks.
The C and
C clocks may be used to clock the data out of the output
register during read operations and to generate the echo clocks. C and
C must be presented to the SRAM within the timing tolerances. The
output data from the DDRII SIO will be closely aligned to the C and
C
input, through the use of an internal DLL. When C is presented to the
DDRII SIO SRAM, the DLL will have already internally clocked the data
to arrive at the device output simultaneously with the arrival of the
C
clock. The C and second data item of the burst will also correspond.
Single Clock Mode
The DDRII SIO SRAM may be operated with a single clock pair. C
and
C may be disabled by tying both signals high, forcing the outputs
and echo clocks to be controlled instead by the K and
K clocks.
DLL Operation
The DLL in the output structure of the DDRII SIO SRAM can be
used to closely align the incoming clocks C and
C with the output of the
data, generating very tight tolerances between the two. The user may
disable the DLL by holding
Doff low. With the DLL off, the C and C (or
K and
K if C and C are not used) will directly clock the output register of
the SRAM. With the DLL off, there will be a propagation delay from the
time the clock enters the device until the data appears at the output.
Echo Clock
The echo clocks, CQ and
CQ, are generated by the C and C clocks
(or K,
K if C, C are disabled). The rising edge of C generates the rising
edge of CQ, and the falling edge of
CQ. The rising edge of C generates
the rising edge of
CQ and the falling edge of CQ. This scheme improves
All interfaces of the DDR II SIO are HSTL, allowing speeds beyond
SRAM devices that use any form of TTL interface. The interface can be
scaled to higher voltages (up to 1.9V) to interface with 1.8V systems if
necessary. The device has a VDDQ and a separate Vref, allowing the
user to designate the interface operational voltage, independent of the
device core voltage of 1.8V VDD. The output impedance control allows
the user to adjust the drive strength to adapt to a wide range of loads and
transmission lines.
the correlation of the rising and falling edges of the echo clock and will
improve the duty cycle of the individual signals.
The echo clock is very closely aligned with the data, guaranteeing
that the echo clock will remain closely correlated with the data, within the
tolerances designated.
Read and Write Operations
DDRII SIO devices internally store the two words of the burst as a
single wide word and the words will retain their burst order. There is no
ability to address an individual word level in a burst, as is possible in the
DDRII common I/O devices. The byte and nibble write signals can be
used to prevent writing to any individual bytes, or combined to prevent
writing word(s) of the burst.
Read operations are initiated by holding Read/Write control input
(R/
W) high, the load control input (LD) low and presenting the read
address to the address port during the rising edge of K, which will latch
the address. The data will then be read and will appear at the device
output at the designated time in correspondence with the C and
C clocks.
Write operations are initiated by holding the Read/Write control input
(R/
W) low, the load control input (LD) low and presenting the write
address to the address port during the rising edge of K, which will latch
the address. On the following rising edge of K, the first word of the two
word burst must be present on the data input bus DQ[x:O], along with the
appropriate byte write or nibble write (
BWx or NWx) inputs. On the
following rising edge of
K, the second half of the data write burst will be
accepted at the device input with the designated (
BWx or NWx) inputs.
Output Enables
The DDRII SIO SRAM automatically enables and disables the Q[X:0]
outputs. When a valid read is in progress, and data is present at the
output, the output will be enabled. If no valid data is present at the output
(read not active), the output will be disabled (high impedance). The
echo clocks will remain valid at all times and cannot be disabled or turned
off. During power-up the Q outputs will come up in a high impedance
state.
Programmable Impedance
An external resistor, RQ, must be connected between the ZQ pin on
the SRAM and Vss to allow the SRAM to adjust its output drive imped-
ance. The value of RQ must be 5X the value of the intended drive
impedance of the SRAM. The allowable range of RQ to guarantee
impedance matching with a tolerance of +/- 10% is between 175 ohms
and 350 ohms, with VDDQ = 1.5V. The output impedance is adjusted
every 1024 clock cycles to correct for drifts in supply voltage and tem-
perature. If the user wishes to drive the output impedance of the SRAM
to it’s lowest value, the ZQ pin may be tied to VDDQ.
generated by the same source that drives the data output, the relation-
ship to the data is not significantly affected by voltage, temperature and
process, as would be the case if the clock were generated by an outside
source.


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