Part Name
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CY7C1012AV33_06

 512K x 24 Static RAM ( 9 Page)


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CY7C1012AV33
Document #: 38-05254 Rev. *E
Page 3 of 9
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65
°C to +150°C
Ambient Temperature with
Power Applied............................................. –55
°C to +125°C
Supply Voltage on VCC to Relative GND
[3] .... –0.5V to +4.6V
DC Voltage Applied to Outputs
in High-Z State[3] ....................................–0.5V to VCC + 0.5V
DC Input Voltage[3] ................................ –0.5V to VCC + 0.5V
Current into Outputs (LOW)......................................... 20 mA
Operating Range
Range
Ambient
Temperature
VCC
Commercial
0
°C to +70°C
3.3V
± 0.3V
Industrial
–40
°C to +85°C
DC Electrical Characteristics Over the Operating Range
Parameter
Description
Test Conditions[4]
–8
–10
Unit
Min.
Max.
Min.
Max.
VOH
Output HIGH Voltage
VCC = Min., IOH = –4.0 mA
2.4
2.4
V
VOL
Output LOW Voltage
VCC = Min., IOL = 8.0 mA
0.4
0.4
V
VIH
Input HIGH Voltage
2.0
VCC + 0.3
2.0
VCC + 0.3
V
VIL
[3]
Input LOW Voltage
–0.3
0.8
–0.3
0.8
V
IIX
Input Leakage Current
GND < VI < VCC
–1
+1
–1
+1
µA
IOZ
Output Leakage Current GND < VOUT < VCC, Output
Disabled
–1
+1
–1
+1
µA
ICC
VCC Operating
Supply Current
VCC = Max.,
f = fMAX = 1/tRC
Commercial
300
275
mA
Industrial
300
275
mA
ISB1
Automatic CE
Power-down Current
—TTL Inputs
Max. VCC, CE > VIH
VIN > VIH or
VIN < VIL, f = fMAX
100
100
mA
ISB2
Automatic CE
Power-down Current
—CMOS Inputs
Max. VCC,
CE > VCC – 0.3V,
VIN > VCC – 0.3V,
or VIN < 0.3V, f = 0
Commercial
/Industrial
50
50
mA
Capacitance[5]
Parameter
Description
Test Conditions
Max.
Unit
CIN
Input Capacitance
TA = 25°C, f = 1 MHz, VCC = 3.3V
8
pF
COUT
I/O Capacitance
10
pF
AC Test Loads and Waveforms[6]
Notes:
3. VIL (min.) = –2.0V for pulse durations of less than 20 ns.
4. CE refers to a combination of CE0, CE1, and CE2. CE is active LOW when all three of these signals are active LOW at the same time.
5. Tested initially and after any design or process changes that may affect these parameters.
90%
10%
3.3V
GND
90%
10%
ALL INPUT PULSES
3.3V
OUTPUT
5 pF
INCLUDING
JIG AND
SCOPE
(a)
(b)
R1 317
R2
351
Rise time > 1 V/ns
Fall time: > 1 V/ns
(c)
OUTPUT
50
Z0 = 50Ω
V
TH = 1.5V
30 pF* * Capacitive Load consists of all
components of the test environment.



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