©2005 Fairchild Semiconductor Corporation

www.fairchildsemi.com

MOC3081M, MOC3082M, MOC3083M Rev. 1.0.3

2

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be

operable above the recommended operating conditions and stressing the parts to these levels is not recommended.

In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.

The absolute maximum ratings are stress ratings only.

Note:

common, and Pins 4, 5 and 6 are common.

Symbol

Parameters

Value

Units

TOTAL DEVICE

Storage Temperature

-40 to +150

°C

Operating Temperature

-40 to +85

°C

Lead Solder Temperature

260 for 10 sec

°C

Junction Temperature Range

-40 to +100

°C

7500

Vac(pk)

Total Device Power Dissipation @ 25°C Ambient

Derate above 25°C

250

mW

2.94

mW/°C

EMITTER

Continuous Forward Current

60

mA

Reverse Voltage

6

V

Total Power Dissipation @ 25°C Ambient

Derate above 25°C

120

mW

1.41

mW/°C

DETECTOR

Off-State Output Terminal Voltage

800

V

Peak Repetitive Surge Current (PW = 100µs, 120pps)

1

A

Total Power Dissipation @ 25°C Ambient

Derate above 25°C

150

mW

1.76

mW/°C