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89HPES48T12ZABR Datasheet(PDF) 10 Page - Integrated Device Technology |
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89HPES48T12ZABR Datasheet(HTML) 10 Page - Integrated Device Technology |
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10 / 47 page  10 of 47 July 19, 2007 IDT 89HPES48T12 Data Sheet Signal Type Name/Description JTAG_TCK I JTAG Clock. This is an input test clock used to clock the shifting of data into or out of the boundary scan logic or JTAG Controller. JTAG_TCK is independent of the system clock with a nominal 50% duty cycle. JTAG_TDI I JTAG Data Input. This is the serial data input to the boundary scan logic or JTAG Controller. JTAG_TDO O JTAG Data Output. This is the serial data shifted out from the boundary scan logic or JTAG Controller. When no data is being shifted out, this signal is tri-stated. JTAG_TMS I JTAG Mode. The value on this signal controls the test mode select of the boundary scan logic or JTAG Controller. JTAG_TRST_N I JTAG Reset. This active low signal asynchronously resets the boundary scan logic and JTAG TAP Controller. An external pull-up on the board is recommended to meet the JTAG specification in cases where the tester can access this signal. However, for systems running in functional mode, one of the following should occur: 1) actively drive this signal low with control logic 2) statically drive this signal low with an external pull-down on the board Table 6 Test Pins Signal Type Name/Description VDDCORE I Core VDD. Power supply for core logic. VDDIO I I/O VDD. LVTTL I/O buffer power supply. VDDPE I PCI Express Digital Power. PCI Express digital power used by the digital power of the SerDes. VDDAPE I PCI Express Analog Power. PCI Express analog power used by the PLL and bias generator. VSS I Ground. VTTPE I PCI Express Serial Data Transmit Termination Voltage. This pin allows the driver termination voltage to be set, enabling the system designer to control the Common Mode Voltage and output voltage swing of the corresponding PCI Serial Data Transmit differential pair. Table 7 Power and Ground Pins |
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