OPA734, OPA2734

OPA735, OPA2735

SBOS282B − DECEMBER 2003 − REVISED FEBRUARY 2005

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3

At TA = +25°C, RL = 10kΩ connected to VS/2, and VOUT = VS/2, unless otherwise noted.

OPA734, OPA2734, OPA735, OPA2735

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNIT

OFFSET VOLTAGE

Input Offset Voltage

VOS

1

5

µV

vs Temperature

dVOS/dT

0.01

0.05

µV/°C

vs Power Supply

PSRR

VS = 2.7V to 12V, VCM = 0V

0.2

1.8

µV/V

Long-Term Stability

Note (1)

Channel Separation, dc

0.1

µV/V

INPUT BIAS CURRENT

Input Bias Current

IB

VCM = VS/2

±100

±200

pA

over Temperature

See Typical Characteristics

pA

Input Offset Current

IOS

VCM = VS/2

±200

±300

pA

NOISE

Input Voltage Noise, f = 0.01Hz to 1Hz

en

0.8

µVPP

Input Voltage Noise, f = 0.1Hz to 10Hz

en

2.5

µVPP

Input Voltage Noise Density, f = 1kHz

en

135

nV/

√Hz

Input Current Noise Density, f = 1kHz

in

40

fA/

√Hz

INPUT VOLTAGE RANGE

Common-Mode Voltage Range

VCM

(V−) − 0.1

(V+) − 1.5

V

Common-Mode Rejection Ratio

CMRR

(V−) − 0.1V < VCM < (V+) − 1.5V

115

130

dB

INPUT CAPACITANCE

Differential

2

pF

Common-Mode

10

pF

OPEN-LOOP GAIN

Open-Loop Voltage Gain

AOL

(V−) + 100mV < VO < (V+) − 100mV

115

130

dB

FREQUENCY RESPONSE

Gain-Bandwidth Product

GBW

1.6

MHz

Slew Rate

SR

G = +1

1.5

V/

µs

OUTPUT

Voltage Output Swing from Rail

RL = 10kΩ

20

50

mV

Short-Circuit Current

ISC

±20

mA

Open-Loop Output Impedance

f = 1MHz, IO = 0

125

Ω

Capacitive Load Drive

CLOAD

See Typical Characteristics

ENABLE/SHUTDOWN

tOFF

1.5

µs

tON(2)

150

µs

VL (amplifier is shutdown)

V−

(V−) + 0.8

V

VH (amplifier is active)

(V−) + 2

V+

V

IQSD (per amplifier)

4

9

µA

Input Bias Current of Enable Pin

3

µA

POWER SUPPLY

Operating Voltage Range

VS

2.7 to 12

(

±1.35 to ±6)

V

Quiescent Current (per amplifier)

IQ

IO = 0

0.6

0.75

mA

TEMPERATURE RANGE

Specified Range

−40

+85

°C

Operating Range

−40

+150

°C

Storage Range

−65

+150

°C

Thermal Resistance

qJA

°C/W

SOT23-5, SOT23-6

200

°C/W

MSOP-8, MSOP-10, SO-8

150

°C/W

(1) 300-hour life test at 150°C demonstrated randomly distributed variation in the range of measurement limits—approximately 1µV.

(2) Device requires one complete auto-zero cycle to return to VOS accuracy.