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SCN2681TC1N40 Datasheet(PDF) 8 Page - NXP Semiconductors |
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SCN2681TC1N40 Datasheet(HTML) 8 Page - NXP Semiconductors |
8 / 14 page Philips Semiconductors Product specification SCN2681T Dual asynchronous receiver/transmitter (DUART) 1998 Sep 04 8 RDN IP0–IP6 WRN OP0–OP7 tPS tPH OLD DATA NEW DATA (a) INPUT PINS tPD (b) OUTPUT PINS SD00101 Figure 5. Port Timing SYMBOL PARAMETER1 LIMITS UNIT SYMBOL PARAMETER1 Min Max UNIT tPS Port input setup time before RDN low 0 ns tPH Port input hold time after RDN high 0 ns tPD Port output valid after WRN high 200 ns NOTE: 1. For bus operations, CEN and RDN (also CEN and WRN) are ANDed internally. As a consequence, the signal asserted last initiates the cycle and the signal negated first terminates the cycle. NOTES: 1. INTRN or OP3-OP7 when used as interrupt outputs. 2. The test for open drain outputs is intended to guarantee switching of the output transistor. Measurement of this response is referenced from the midpoint of the switching signal, VM, to a point 0.5V above VOL. This point represents noise margin that assures true switching has occurred. Beyond this level, the effects of external circuitry and test environment are pronounced and can greatly affect the resultant measurement. VM VOL +0.5V VOL WRN INTERRUPT1 OUTPUT tIR SD00102 Figure 6. Interrupt Timing SYMBOL PARAMETER LIMITS UNIT SYMBOL PARAMETER Min Max UNIT INTRN (or OP3–OP7 when used as interrupts) negated from: Read RHR (RxRDY/FFULL interrupt) 200 ns Write THR (TxRDY interrupt) 200 ns tIR Reset command (delta break interrupt) 200 ns Stop C/T command (counter interrupt) 200 ns Read IPCR (input port change interrupt) 200 ns Write IMR (clear of interrupt mask bit) 200 ns |
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